Characterization of Porous Silicon Layers Containing A Buried Oxide Layer
2003 ◽
Vol 376
(5-6)
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pp. 748-752
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2021 ◽
Vol 1829
(1)
◽
pp. 012021
2021 ◽
Vol 1126
(1)
◽
pp. 012006
2000 ◽
Vol 182
(1)
◽
pp. 473-477
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2018 ◽
Vol 1003
◽
pp. 012087
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