Friction and wear at low temperatures

1971 ◽  
Vol 13 (3) ◽  
pp. 186-188 ◽  
Author(s):  
G. N. Presnyakova ◽  
I. M. Lyubarskii ◽  
V. F. Udovenko ◽  
E. I. Mar'yakhina ◽  
S. S. Chernyak
Keyword(s):  
Low Temperatures ◽  
Friction And Wear

Friction and Wear of Carbon Fibre Filled Polymer Composites at Room and Low Temperatures

2004 ◽  
Vol 35 (10-11) ◽  
pp. 683-689 ◽  
Author(s):  
G. Theiler ◽  
W. Hübner ◽  
Th. Gradt ◽  
P. Klein
Keyword(s):  
Carbon Fibre ◽  
Polymer Composites ◽  
Low Temperatures ◽  
Friction And Wear ◽  
Filled Polymer

Friction and wear of steels, hard alloy, and polyfluoroethylene materials at low temperatures

1968 ◽  
Vol 4 (12) ◽  
pp. 1004-1007 ◽  
Author(s):  
E. I. Vorob'ev ◽  
Yu. F. Malyshkin ◽  
V. M. Grushevskii ◽  
M. V. Belen'kii
Keyword(s):  
Hard Alloy ◽  
Low Temperatures ◽  
Friction And Wear

An apparatus for studying friction and wear at low temperatures in vacuum

Cryogenics ◽  
1974 ◽  
Vol 14 (5) ◽  
pp. 287-288
Author(s):  
N.N. Golego ◽  
E.A. Kul'gavyi
Keyword(s):  
Low Temperatures ◽  
Friction And Wear

Interpretation of irradiation-induced changes in electron diffractograms and images of extinction contours at low temperatures

1984 ◽  
Vol 42 ◽  
pp. 268-269
Author(s):  
E. Knapek ◽  
H. Formanek ◽  
G. Lefranc ◽  
I. Dietrich
Keyword(s):  
Low Temperatures ◽  
Carbon Films ◽  
Organic Crystals ◽  
Wide Spread ◽  
Lens System ◽  
Preparation Conditions ◽  
Thin Carbon ◽  
Electron Diffractograms ◽  
Diffraction Patterns ◽  
Induced Changes

A few years ago results on cryoprotection of L-valine were reported, where the values of the critical fluence De i.e, the electron exposure which decreases the intensity of the diffraction reflections by a factor e, amounted to the order of 2000 + 1000 e/nm2. In the meantime a discrepancy arose, since several groups published De values between 100 e/nm2 and 1200 e/nm2 /1 - 4/. This disagreement and particularly the wide spread of the results induced us to investigate more thoroughly the behaviour of organic crystals at very low temperatures during electron irradiation.For this purpose large L-valine crystals with homogenuous thickness were deposited on holey carbon films, thin carbon films or Au-coated holey carbon films. These specimens were cooled down to nearly liquid helium temperature in an electron microscope with a superconducting lens system and irradiated with 200 keU-electrons. The progress of radiation damage under different preparation conditions has been observed with series of electron diffraction patterns and direct images of extinction contours.

Radiation Damage of Support Films

1981 ◽  
Vol 39 ◽  
pp. 28-29
Author(s):  
H.A. Cohen ◽  
W. Chiu
Keyword(s):  
Transfer Function ◽  
Low Temperatures ◽  
Carbon Support ◽  
Contrast Transfer Function ◽  
Electron Dose ◽  
Imaging Parameters ◽  
Negative Stain ◽  
Phase Corrections ◽  
Two Parameters ◽  
Medium Dose

The goal of imaging the finest detail possible in biological specimens leads to contradictory requirements for the choice of an electron dose. The dose should be as low as possible to minimize object damage, yet as high as possible to optimize image statistics. For specimens that are protected by low temperatures or for which the low resolution associated with negative stain is acceptable, the first condition may be partially relaxed, allowing the use of (for example) 6 to 10 e/Å2. However, this medium dose is marginal for obtaining the contrast transfer function (CTF) of the microscope, which is necessary to allow phase corrections to the image. We have explored two parameters that affect the CTF under medium dose conditions.Figure 1 displays the CTF for carbon (C, row 1) and triafol plus carbon (T+C, row 2). For any column, the images to which the CTF correspond were from a carbon covered hole (C) and the adjacent triafol plus carbon support film (T+C), both recorded on the same micrograph; therefore the imaging parameters of defocus, illumination angle, and electron statistics were identical.

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