An even magneto-optic effect: Linear polarization of the spectral thermal emission from ferromagnetic iron

1984 ◽  
Vol 5 (4) ◽  
pp. 531-536 ◽  
Author(s):  
Rolf Br�nnimann ◽  
Fritz K. Kneub�hl
2018 ◽  
Vol 14 (A30) ◽  
pp. 128-129
Author(s):  
Francesca Bacciotti ◽  
Josep Miquel Girart ◽  
Marco Padovani

AbstractThe Atacama Large Millimeter/submillimeter Array (ALMA) is providing important advances in studies of star formation. In particular, polarimetry can reveal the disk magnetic configuration, a crucial ingredient in many processes, as, for example, the transport of angular momentum. We analized ALMA Band 7 (870 μm) polarimetric data at 0.”2 resolution for the young rotating disk/jet systems DG Tau and CW Tau, to find magnetic signatures. From the Stokes I, U, Q maps, we derive the linear polarization intensity, $P = \sqrt {{Q^2} + {U^2}} $ , the linear polarization fraction, and the polarization angle. The alignment of the latter with the disk minor axis (Fig. 1) shows that self-scattering of dust thermal emission rather than magnetic alignment dominates the polarization in both targets (Bacciotti et al. 2018). However, several dust properties can be diagnosed comparing the polarization data with the models of self-scattering (e.g. Kataoke et al. 2017, Yang et al. 2017). The maximum grain size turns out to be in the range 50 - 70 μm for DG Tau and 100 - 150 μm for CW Tau. The asymmetry of the polarized intensity in DG Tau, observed for the first time around a T Tauri star, indicates that the disk is flared. Moreover, the observed belt-like feature may betray the presence of a disk substructure. In contrast, the polarization maps of CW Tau indicate that here the grains have settled to the disk midplane. Polarimetry is thus very important in studies of the dust evolution.


2019 ◽  
Vol 491 (2) ◽  
pp. 1771-1776 ◽  
Author(s):  
K Wiersema ◽  
A B Higgins ◽  
A J Levan ◽  
R A J Eyles ◽  
R L C Starling ◽  
...  

ABSTRACT A small fraction of candidate tidal disruption events (TDEs) show evidence of powerful relativistic jets, which are particularly pronounced at radio wavelengths, and likely contribute non-thermal emission at a wide range of wavelengths. A non-thermal emission component can be diagnosed using linear polarimetry, even when the total received light is dominated by emission from an accretion disc or disc outflow. In this paper, we present Very Large Telescope (VLT) measurements of the linear polarization of the optical light of jetted TDE Swift J2058+0516. This is the second jetted TDE studied in this manner, after Swift J1644+57. We find evidence of non-zero optical linear polarization, $P_{V}\sim 8{{\, \rm per\, cent}}$, a level very similar to the near-infrared polarimetry of Swift J1644+57. These detections provide an independent test of the emission mechanisms of the multiwavelength emission of jetted TDEs.


1998 ◽  
Vol 184 ◽  
pp. 161-168
Author(s):  
Yoshiaki Sofue

The radio emission from the Galactic Center is a mixture of thermal (free-free) and non-thermal (synchrotron) emissions (Fig. 1a). However, the spectral index in the central 3° region is flat almost everywhere (Sofue 1985), even in regions where strong linear polarization is detected. Therefore, a flat spectrum observed near the galactic center can no longer be taken as an indicator of thermal emission.


1977 ◽  
Vol 64 (2) ◽  
pp. 249-250 ◽  
Author(s):  
K. Müller ◽  
F. Fuchs ◽  
F.K. Kneubühl

Author(s):  
W. T. Pike

With the advent of crystal growth techniques which enable device structure control at the atomic level has arrived a need to determine the crystal structure at a commensurate scale. In particular, in epitaxial lattice mismatched multilayers, it is of prime importance to know the lattice parameter, and hence strain, in individual layers in order to explain the novel electronic behavior of such structures. In this work higher order Laue zone (holz) lines in the convergent beam microdiffraction patterns from a thermal emission transmission electron microscope (TEM) have been used to measure lattice parameters to an accuracy of a few parts in a thousand from nanometer areas of material.Although the use of CBM to measure strain using a dedicated field emission scanning transmission electron microscope has already been demonstrated, the recording of the diffraction pattern at the required resolution involves specialized instrumentation. In this work, a Topcon 002B TEM with a thermal emission source with condenser-objective (CO) electron optics is used.


1997 ◽  
Vol 7 (C2) ◽  
pp. C2-439-C2-440
Author(s):  
O. Isnard ◽  
S. Miraglia ◽  
Ch. Giorgetti ◽  
F. Baudelet ◽  
E. Dartyge ◽  
...  
Keyword(s):  
X Ray ◽  

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