Temperature and annealing effects on the optical absorption edge of amorphous SiO/B2O3 thin films

1986 ◽  
Vol 5 (7) ◽  
pp. 681-684 ◽  
Author(s):  
M. H. Islam ◽  
C. A. Hogarth
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Edge ◽  
Optical Absorption Edge ◽  
Annealing Effects

scholarly journals Optical absorption edge shifts in electrodeposited ZnO thin films

2007 ◽  
Vol 515 (20-21) ◽  
pp. 7976-7983 ◽  
Author(s):  
Tingting Ren ◽  
Holly R. Baker ◽  
Kristin M. Poduska
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Edge ◽  
Zno Thin Films ◽  
Optical Absorption Edge

Optical Absorption Edge of SnTe Thin Films

2007 ◽  
Author(s):  
N. N. Zheleva ◽  
D. B. Kushev ◽  
St. B. Peshkalova ◽  
T. N. Nevzat
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Edge ◽  
Optical Absorption Edge

Optical absorption edge of ZnO thin films: The effect of substrate

1997 ◽  
Vol 81 (9) ◽  
pp. 6357-6364 ◽  
Author(s):  
V. Srikant ◽  
D. R. Clarke
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Edge ◽  
Zno Thin Films ◽  
Optical Absorption Edge

Evaluation of the Tauc method for optical absorption edge determination: ZnO thin films as a model system

2015 ◽  
Vol 252 (8) ◽  
pp. 1700-1710 ◽  
Author(s):  
Brian D. Viezbicke ◽  
Shane Patel ◽  
Benjamin E. Davis ◽  
Dunbar P. Birnie
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Edge ◽  
Model System ◽  
Zno Thin Films ◽  
Optical Absorption Edge

scholarly journals Evaluation of the Tauc method for optical absorption edge determination: ZnO thin films as a model system (Phys. Status Solidi B 8/2015)

2015 ◽  
Vol 252 (8) ◽  
pp. n/a-n/a
Author(s):  
Brian D. Viezbicke ◽  
Shane Patel ◽  
Benjamin E. Davis ◽  
Dunbar P. Birnie
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Edge ◽  
Model System ◽  
Zno Thin Films ◽  
Optical Absorption Edge

Urbach Edge, Disorder, and Absorption On-set in a-Si:H

2005 ◽  
Vol 862 ◽  
Author(s):  
G. D. Cody
Keyword(s):  
Thin Films ◽  
Standard Model ◽  
Optical Absorption ◽  
Amorphous Silicon ◽  
Absorption Edge ◽  
Optical Characterization ◽  
Theoretical Development ◽  
Current Status ◽  
Optical Absorption Edge

AbstractThis paper presents a brief review of the research that began in the early '80s, continued through the '90s, and produced a “standard model” for the optical absorption edge of amorphous silicon. The research began as a response to the invention of a-Si:H solar cells by Carlson and Wronski at RCA laboratories in 1976, and the subsequent worldwide interest in the optical characterization of a-Si:H thin films. The immediate need was soon met, but the research continued as an effort to understand the physics of the optical absorption edge in a-Si:H, as well as to understand the differences between, and similarities to, the indirect optical absorption edge of c-Si. In this paper, we highlight the successes of this standard model, and briefly cover its experimental and theoretical development over the last 25 years. We summarize its current status, and suggest some experimental and theoretical opportunities for, and challenges to, what may now be called a standard model for the optical absorption edge of both a-Si:H and a-Ge:H.

Sign in / Sign up

Export Citation Format

Share Document