Local structure and valence of impurity ions in oxides by TDPAC and Mössbauer emission spectroscopy

1995 ◽  
Vol 190 (2) ◽  
pp. 215-224 ◽  
Author(s):  
F. Ambe ◽  
Y. Ohkubo ◽  
S. Ambe ◽  
Y. Kobayashi ◽  
T. Okada ◽  
...  
Keyword(s):  
Local Structure ◽  
Emission Spectroscopy ◽  
Impurity Ions

scholarly journals Structural Analysis of the BaWO4 Crystal Doped with Ce and Codoped with Na Ions Based on g-shift Parameters

Crystals ◽  
2020 ◽  
Vol 10 (9) ◽  
pp. 789 ◽  
Author(s):  
Tomasz Bodziony ◽  
Slawomir Maksymilian Kaczmarek
Keyword(s):  
Structural Analysis ◽  
Local Structure ◽  
Perturbation Methods ◽  
Superposition Model ◽  
Shift Method ◽  
Impurity Ions ◽  
Na Ions ◽  
Paramagnetic Ions ◽  
The Relationship ◽  
Good Agreement

The relationship between the g-shift and the local structure of the Ce3+ paramagnetic center with axial symmetry were investigated for four BaWO4 single crystals doped with Ce and codoped with Na. Based on g-shift the displacements of Ce3+ ions are determined. The g-shift method yields displacements of impurity ions in good agreement with the superposition model (SPM) and the perturbation methods (PM) predictions. The structural analysis of the paramagnetic ions and its surrounding in the BaWO4 unit cell was also conducted.

Local structure of porous silicon studied by means of X-ray emission spectroscopy

1997 ◽  
Vol 65 (2) ◽  
pp. 183-189 ◽  
Author(s):  
E.Z. Kurmaev ◽  
V.R. Galakhov ◽  
S.N. Shamin ◽  
V.I. Sokolov ◽  
R.E. Hummel ◽  
...  
Keyword(s):  
Porous Silicon ◽  
Local Structure ◽  
Emission Spectroscopy ◽  
X Ray

scholarly journals Toroidal flow measurements of impurity ions in QUEST ECH plasmas using multiple viewing chords emission spectroscopy

2021 ◽  
Vol 26 ◽  
pp. 100905
Author(s):  
N. Yoneda ◽  
T. Shikama ◽  
K. Hanada ◽  
S. Mori ◽  
T. Onchi ◽  
...  
Keyword(s):  
Emission Spectroscopy ◽  
Flow Measurements ◽  
Impurity Ions

Signal/Noise Ratio and Elemental Detectivity by Eels

1982 ◽  
Vol 40 ◽  
pp. 488-489
Author(s):  
R. F. Egerton
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Elemental Analysis ◽  
Electron Energy Loss Spectroscopy ◽  
Emission Spectroscopy ◽  
X Ray ◽  
Signal Noise ◽  
Characteristic Signal ◽  
Noise Ratio ◽  
Electron Energy Loss

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

DETERMINATION OF THE LOCAL STRUCTURE OF METALLIC GLASSES BY EXAFS

1982 ◽  
Vol 43 (C9) ◽  
pp. C9-43-C9-46 ◽  
Author(s):  
A. Sadoc ◽  
A. M. Flank ◽  
D. Raoux ◽  
P. Lagarde
Keyword(s):  
Metallic Glasses ◽  
Local Structure

LOCAL STRUCTURE IN InGaAsP QUATERNARY ALLOYS

1986 ◽  
Vol 47 (C8) ◽  
pp. C8-423-C8-426
Author(s):  
H. OYANAGI ◽  
Y. TAKEDA ◽  
T. MATSUSHITA ◽  
T. ISHIGURO ◽  
A. SASAKI
Keyword(s):  
Local Structure ◽  
Quaternary Alloys

LOCAL STRUCTURE AND THERMODYNAMICS OF II-VI AND III-V SEMICONDUCTORS BY EXAFS

1986 ◽  
Vol 47 (C8) ◽  
pp. C8-403-C8-406
Author(s):  
N. MOTTA ◽  
A. BALZAROTTI ◽  
P. LETARDI
Keyword(s):  
Local Structure
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