An improved method for obtaining the general-displacement field from a holographic interferogram

Where a finite element possesses symmetry properties, derivation of fundamental element matrices can be achieved more efficiently by decomposing the general displacement field into subspaces of the symmetry group describing the configuration of the element. In this paper, the procedure is illustrated by reference to the simple truss and beam elements, whose well-known consistent-mass matrices are obtained via the proposed method. However, the procedure is applicable to all one-, two- and three-dimensional finite elements, as long as the shape and node configuration of the element can be described by a specific symmetry group.

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An improved method of three-dimensional displacement field generation in mining areas with a single InSAR pair

European Journal of Remote Sensing ◽

10.1080/22797254.2019.1654927 ◽

2019 ◽

Vol 52 (1) ◽

pp. 493-503 ◽

Cited By ~ 5

Author(s):

Hongdong Fan ◽

Binfan Wen ◽

Jie Liu ◽

Jiuli Liu ◽

Jianfeng Yin

Keyword(s):

Displacement Field ◽

Three Dimensional ◽

Improved Method ◽

Mining Areas ◽

Field Generation

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A qualitative investigation of holographic interferometry techniques applied to the measurement of the general displacement field

Strain ◽

10.1111/j.1475-1305.1978.tb01852.x ◽

1978 ◽

Vol 14 (3) ◽

pp. 106-113 ◽

Cited By ~ 1

Author(s):

S. MILLMORE ◽

J. A. ALLSOPP

Keyword(s):

Displacement Field ◽

Holographic Interferometry ◽

Qualitative Investigation ◽

General Displacement

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The Analysis of Dislocations Using a Symmetry Criterion

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100096552 ◽

1972 ◽

Vol 30 ◽

pp. 660-661

Author(s):

J. C. Ingram ◽

P. R. Strutt ◽

Wen-Shian Tzeng

Keyword(s):

Electron Beam ◽

Electron Microscope ◽

Displacement Field ◽

Standard Technique ◽

Residual Image ◽

Symmetry Criterion

The invisibility criterion which is the standard technique for determining the nature of dislocations seen in the electron microscope can at times lead to erroneous results or at best cause confusion in many cases since the dislocation can still show a residual image if the term is non-zero, or if the edge and screw displacements are anisotropically coupled, or if the dislocation has a mixed character. The symmetry criterion discussed below can be used in conjunction with and in some cases supersede the invisibility criterion for obtaining a valid determination of the nature of the dislocation.The symmetry criterion is based upon the well-known fact that a dislocation, because of the symmetric nature of its displacement field, can show a symmetric image when the dislocation is correctly oriented with respect to the electron beam.

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An Improved Method for the Preparation and TEM Examination of Sharp Pointed Tips used in APFIM and STM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100134107 ◽

1990 ◽

Vol 48 (2) ◽

pp. 102-103

Author(s):

E.A. Fischione ◽

P.E. Fischione ◽

J.J. Haugh ◽

M.G. Burke

Keyword(s):

Atom Probe ◽

Preparation Process ◽

Improved Method ◽

Ion Milling ◽

Polishing Process ◽

Probe Field ◽

Scanning Tunnelling ◽

Stm Tips ◽

Tunnelling Microscopy ◽

Ion Microscopy

A common requirement for both Atom Probe Field-Ion Microscopy (APFIM) and Scanning Tunnelling Microscopy (STM) is a sharp pointed tip for use as either the specimen (APFIM) or the probe (STM). Traditionally, tips have been prepared by either chemical or electropolishing techniques. Recently, ion-milling has been successfully employed in the production of APFIM tips [1]. Conventional electropolishing techniques are applicable to a wide variety of metals, but generally require careful manual adjustments during the polishing process and may also be time-consuming. In order to reduce the time and effort involved in the preparation process, a compact, self-contained polishing unit has been developed. This system is based upon the conventional two-stage electropolishing technique in which the specimen/tip blank is first locally thinned or “necked”, and subsequently electropolished until separation occurs.[2,3] The result of this process is the production of two APFIM or STM tips. A mechanized polishing unit that provides these functions while automatically maintaining alignment has been designed and developed.

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Immunoelectron microscopic localization of elastic tissue in archival material using an improved method

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100161539 ◽

1990 ◽

Vol 48 (3) ◽

pp. 794-795

Author(s):

J. C. Fanning ◽

J. F. White ◽

R. Polewski ◽

E. G. Cleary

Keyword(s):

Normal Animal ◽

Animal Tissue ◽

Elastic Tissue ◽

Human Tissues ◽

Improved Method ◽

Tissue Samples ◽

Archival Material ◽

Immuno Electron Microscopy ◽

Arteries And Veins ◽

Biochemical Examination

Elastic tissue is an important component of the walls of arteries and veins, of skin, of the lungs and in lesser amounts, of many other tissues. It is responsible for the rubber-like properties of the arteries and for the normal texture of young skin. It undergoes changes in a number of important diseases such as atherosclerosis and emphysema and on exposure of skin to sunlight.We have recently described methods for the localizationof elastic tissue components in normal animal and human tissues. In the study of developing and diseased tissues it is often not possible to obtain samples which have been optimally prepared for immuno-electron microscopy. Sometimes there is also a need to examine retrospectively samples collected some years previously. We have therefore developed modifications to our published methods to allow examination of human and animal tissue samples obtained at surgery or during post mortem which have subsequently been: 1. stored frozen at -35° or -70°C for biochemical examination; 2.

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