A scanning auger microscopy characterization of the internal oxidation produced on carburizing

1992 ◽  
Vol 9 (2) ◽  
pp. 73-80 ◽  
Author(s):  
J. D. Verhoeven ◽  
Nailu Chen ◽  
A. J. Bevolo
Keyword(s):  
Internal Oxidation ◽  
Scanning Auger Microscopy ◽  
Auger Microscopy ◽  
Microscopy Characterization

Scanning Auger Microscopy Characterization of Magnetic Hard Disc

1997 ◽  
Vol 475 ◽  
Author(s):  
D. W. Harris ◽  
D. L. Neiman ◽  
J. Huang
Keyword(s):  
Thin Layer ◽  
Field Emission ◽  
Small Particle ◽  
Layer Structure ◽  
Structure Characterization ◽  
Atomic Percent ◽  
Scanning Auger Microscopy ◽  
Auger Microscopy ◽  
Microscopy Characterization

ABSTRACTApplications of Zalar rotation and field emission Auger (FE-AES) analysis in various magnetic hard disc problems will be presented. These applications include thin layer structure characterization, low concentration contaminant (0.1–0.5 atomic percent) detection at deeper interfaces (greater than 1000Å), and small particle (-∼1000Å) contaminant identification.

Scanning auger microscopy characterization of magnetic hard disks

1998 ◽  
Author(s):  
Jeffrey R. Kingsley ◽  
David W. Harris ◽  
D. L. Neiman ◽  
Jingyu Huang
Keyword(s):  
Hard Disks ◽  
Scanning Auger Microscopy ◽  
Magnetic Hard Disks ◽  
Auger Microscopy ◽  
Microscopy Characterization

Characterization of CVD-layers by scanning Auger microscopy

1986 ◽  
Vol 9 (5) ◽  
pp. 341-341
Author(s):  
A. Riahi ◽  
M. Puchhammer ◽  
H. Störi ◽  
C. Colombier ◽  
B. Lux
Keyword(s):  
Scanning Auger Microscopy ◽  
Auger Microscopy

Characterization of change of carbon bonding due to sliding wear damage by scanning Auger microscopy

1993 ◽  
Vol 29 (6) ◽  
pp. 3939-3941 ◽  
Author(s):  
T.-A. Yeh ◽  
C.-L. Lin ◽  
J.M. Sivertsen ◽  
J.H. Judy ◽  
G.-L. Chen
Keyword(s):  
Sliding Wear ◽  
Scanning Auger Microscopy ◽  
Wear Damage ◽  
Auger Microscopy ◽  
Carbon Bonding

scholarly journals Characterization of Sic Fibers by Soft X-Ray Photoelectron and Photoabsorption Spectroscopies and Scanning Auger Microscopy

1996 ◽  
Vol 437 ◽  
Author(s):  
Qing Ma ◽  
M. W. Mcdowell ◽  
R. A. Rosenberg
Keyword(s):  
Depth Profiling ◽  
Chemical Vapor ◽  
Layer Depth ◽  
X Ray ◽  
Sic Fibers ◽  
Line Shapes ◽  
Scanning Auger Microscopy ◽  
Auger Microscopy ◽  
Sic Coatings

AbstractSynchrotron radiation soft x-ray photoelectron and photoabsorption spectroscopy was used to characterize commercially obtained SiC fibers, which were produced by chemical vapor deposition (CVD) of SiC on a W core, followed by a carbon passivating layer. Depth profiling of the fiber through the carbon/SiC interface was done by making Si 2p and C ls core level PES and PAS, as well as scanning Auger microscopy, measurements following Ar+ sputtering. No significant changes in either photoemission or absorption or Auger line shapes were observed as a function of the depth, which indicates that there is no significant interfacial reaction. The line shapes of the carbonaceous coatings are predominately graphite-like and those of the CVD SiC coatings are microcrystalline, with presence of disorder to some extent in both cases.

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