AbstractSynchrotron radiation soft x-ray photoelectron and photoabsorption spectroscopy was used to characterize commercially obtained SiC fibers, which were produced by chemical vapor deposition (CVD) of SiC on a W core, followed by a carbon passivating layer. Depth profiling of the fiber through the carbon/SiC interface was done by making Si 2p and C ls core level PES and PAS, as well as scanning Auger microscopy, measurements following Ar+ sputtering. No significant changes in either photoemission or absorption or Auger line shapes were observed as a function of the depth, which indicates that there is no significant interfacial reaction. The line shapes of the carbonaceous coatings are predominately graphite-like and those of the CVD SiC coatings are microcrystalline, with presence of disorder to some extent in both cases.
Characterization of Sic Fibers by Soft X-Ray Photoelectron and Photoabsorption Spectroscopies and Scanning Auger Microscopy