Single-electron trapping at semiconductor interfaces

Advances in Solid State Physics 35 - Advances in Solid State Physics ◽

10.1007/bfb0107548 ◽

2007 ◽

pp. 229-242 ◽

Cited By ~ 4

Author(s):

M. Schulz ◽

H. H. Mueller

Keyword(s):

Single Electron ◽

Electron Trapping ◽

Semiconductor Interfaces

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Observation of single electron trapping using scanning tunneling microscopy

10.1109/iedm.1987.191489 ◽

1987 ◽

Cited By ~ 1

Author(s):

R.H. Koch ◽

R.J. Hamers

Keyword(s):

Scanning Tunneling Microscopy ◽

Single Electron ◽

Electron Trapping ◽

Scanning Tunneling ◽

Tunneling Microscopy

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Electron trapping: Hysteretic relativistic resonance of a single electron

Nature ◽

10.1038/317476a0 ◽

1985 ◽

Vol 317 (6037) ◽

pp. 476-477 ◽

Cited By ~ 8

Author(s):

A. E. Kaplan

Keyword(s):

Single Electron ◽

Electron Trapping

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New experimental observations of single electron trapping properties of Si nanoclusters in SRO obtained by LPCVD

Materials Science in Semiconductor Processing ◽

10.1016/j.mssp.2004.01.004 ◽

2004 ◽

Vol 7 (1-2) ◽

pp. 45-50 ◽

Cited By ~ 3

Author(s):

Zhenrui Yu ◽

Mariano Aceves ◽

Jesus Carrillo

Keyword(s):

Single Electron ◽

Electron Trapping

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Conductance modulation of submicrometer metal–oxide–semiconductor field-effect transistors by single-electron trapping

Journal of Applied Physics ◽

10.1063/1.361785 ◽

1996 ◽

Vol 79 (8) ◽

pp. 4178 ◽

Cited By ~ 42

Author(s):

H. H. Mueller ◽

M. Schulz

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistors ◽

Metal Oxide Semiconductor ◽

Single Electron ◽

Oxide Semiconductor ◽

Electron Trapping ◽

Conductance Modulation

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Single-electron trapping in sub-μm sized MOSFETs

Microelectronics Reliability ◽

10.1016/s0026-2714(97)82543-7 ◽

1997 ◽

Vol 37 (8) ◽

pp. 1289

Keyword(s):

Single Electron ◽

Electron Trapping

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Single-electron trapping and telegraph noise in μm-sized MOSFETS

10.1063/1.44370 ◽

1992 ◽

Cited By ~ 1

Author(s):

M. Schulz ◽

A. Pappas ◽

J. Vennemann

Keyword(s):

Single Electron ◽

Electron Trapping ◽

Telegraph Noise

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Parallel optical logic processor and bit slice-full adder using a single electron trapping device

Optics & Laser Technology ◽

10.1016/s0030-3992(98)00029-2 ◽

1998 ◽

Vol 30 (3-4) ◽

pp. 175-182 ◽

Cited By ~ 4

Author(s):

Hao Ruan ◽

Shuchun Cheng ◽

Fuxi Gan

Keyword(s):

Full Adder ◽

Single Electron ◽

Electron Trapping ◽

Optical Logic ◽

Trapping Device

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Conductance modulation by single-electron trapping in sub-μm MOSFETs

Microelectronic Engineering ◽

10.1016/0167-9317(95)00036-8 ◽

1995 ◽

Vol 28 (1-4) ◽

pp. 163-166 ◽

Cited By ~ 2

Author(s):

H.H. Mueller ◽

U. Schirl ◽

M. Schulz

Keyword(s):

Single Electron ◽

Electron Trapping ◽

Conductance Modulation

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Ligand-Localized Electron Trapping at Sensitized Semiconductor Interfaces

Journal of the American Chemical Society ◽

10.1021/ja0268478 ◽

2002 ◽

Vol 124 (33) ◽

pp. 9690-9691 ◽

Cited By ~ 29

Author(s):

Paul G. Hoertz ◽

David W. Thompson ◽

Lee A. Friedman ◽

Gerald J. Meyer

Keyword(s):

Electron Trapping ◽

Semiconductor Interfaces

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Observations of single electron trapping/detrapping events in tunnel oxide of SuperFlash/spl trade/ memory cell

Proceedings 2004 IEEE Computational Systems Bioinformatics Conference NVMT-04 ◽

10.1109/nvmt.2004.1380803 ◽

2005 ◽

Cited By ~ 10

Author(s):

Y. Tkachev ◽

Xian Liu ◽

A. Kotov ◽

V. Markov ◽

A. Levi

Keyword(s):

Memory Cell ◽

Single Electron ◽

Electron Trapping

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