Hessian fly-resistance gene transferred from chromosome 4Mv of Aegilops ventricosa to Triticum aestivum

1997 ◽  
Vol 94 (6-7) ◽  
pp. 858-864 ◽  
Author(s):  
A. Delibes ◽  
J. Del Moral ◽  
J. A. Martín-Sanchez ◽  
A. Mejias ◽  
M. Gallego ◽  
...  
Crop Science ◽  
2010 ◽  
Vol 50 (2) ◽  
pp. 612-616 ◽  
Author(s):  
L. M. Miranda ◽  
D. E. Bland ◽  
S. E. Cambron ◽  
J. H. Lyerly ◽  
J. Johnson ◽  
...  

2011 ◽  
Vol 47 (Special Issue) ◽  
pp. S63-S66 ◽  
Author(s):  
E. Sin ◽  
J. Del Moral ◽  
P. Hernández ◽  
E. Benavente ◽  
M. Rubio ◽  
...  

Advanced wheat lines carrying the Hessian fly resistance gene H27 were obtained by backcrossing the wheat/Aegilops ventricosa introgression line, H-93-33, to commercial wheat cultivars as recurrent parents. The Acph-N<sup>v</sup>1 marker linked to the gene H27 on the 4N<sup>v</sup> chromosome of this line was used for marker assisted selection. Advanced lines were evaluated for Hessian fly resistance in field and growth chamber tests, and for other agronomic traits during several crop seasons at different localities of Spain. The hessian fly resistance levels of lines carrying the 4N<sup>v </sup>chromosome introgression (4D/4N<sup>v</sup> substitution and recombination lines that previously were classified by in situ hybridisation) were high, but always lower than that of their Ae.&nbsp;ventricosa progenitor. Introgression lines had higher grain yields in infested field trials than those without the 4N<sup>v</sup>&nbsp;chromosome and their susceptible parents, but lower grain yields under high yield potential conditions. The 4N<sup>v</sup>&nbsp;introgression was also associated with later heading, and lower tiller and grain numbers/m<sup>2</sup>. In addition, it was associated with longer and more lax spikes, and higher values of grain weight and grain protein content. However, the glutenin and gliadin expression, as well as the bread-making performance, were similar to those of their recurrent parents.


2002 ◽  
Vol 105 (5) ◽  
pp. 766-770 ◽  
Author(s):  
I. Dweikat ◽  
W. Zhang ◽  
H. Ohm

2005 ◽  
Vol 124 (6) ◽  
pp. 525-531 ◽  
Author(s):  
L. Kong ◽  
H. W. Ohm ◽  
S. E. Cambron ◽  
C. E. Williams

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