Anatomic bases of a new technique of juxta-acetabular osteotomy: Technical principles and performance

1998 ◽  
Vol 20 (3) ◽  
pp. 153-159
Author(s):  
J. Y. Lazennec ◽  
N. Mora Valladares ◽  
C. G. Laudet ◽  
D. Barabas ◽  
S. Ramare ◽  
...  
Keyword(s):  
New Technique ◽  
A New Technique ◽  
And Performance ◽  
Technical Principles

Anatomic bases of a new technique of juxta-acetabular osteotomy technical principles and performance

1998 ◽  
Vol 20 (3) ◽  
pp. 153-159
Author(s):  
J. Y. Lazennec ◽  
N. Mora Valladares ◽  
C. G. Laudet ◽  
D. Barabas ◽  
S. Ramare ◽  
...  
Keyword(s):  
New Technique ◽  
A New Technique ◽  
And Performance ◽  
Technical Principles

A new technique for the simultaneous, real-time measurement of membrane compaction and performance during exposure to high-pressure gas

2000 ◽  
Vol 171 (2) ◽  
pp. 217-228 ◽  
Author(s):  
Veronika E Reinsch ◽  
Alan R Greenberg ◽  
Stephen S Kelley ◽  
Rorik Peterson ◽  
Leonard J Bond
Keyword(s):  
High Pressure ◽  
Real Time ◽  
Time Measurement ◽  
New Technique ◽  
Real Time Measurement ◽  
A New Technique ◽  
And Performance

scholarly journals ASMD-FSMD Technique for Designing Digital Devices on FPGA

2020 ◽  
Author(s):  
Valery Salauyou
Keyword(s):  
Traditional Approach ◽  
New Technique ◽  
Digital Device ◽  
New Techniques ◽  
Digital Devices ◽  
Finite State ◽  
Field Programmable ◽  
A New Technique ◽  
And Performance ◽  
The One

Recently, there has been, on the one hand, an increase in the complexity of digital device designs and, on the other hand, an increase in the requirements for the development time and the reliability of the designs. One of the directions of solving this problem is developing new techniques for designing digital devices.This paper proposes a new technique for designing digital devices based on finite state machines with datapath (FSMD), when the functioning of the device is described in the form of an algorithm state machine with datapath (ASMD) charts. The new technique is called ASMD-FSMD. Different digital device design techniques are compared to each other using design examples of a synchronous multiplier on field programmable gate array (FPGA). The efficiency of the ASMD-FSMD technique compared to the traditional approach in terms of area and performance was investigated. The ASMD-FSMD technique, compared to the traditional one, reduces the area from 28.6% to 39.7% and increases the speed for some designs to 17.6%. In addition, using the ASMD-FSMD technique significantly reduces design time and increases design reliability. In conclusion, recommendations for using the ASMD-FSMD technique are made.

scholarly journals Technology for soil preparation in greenhouses for sowing seeds using a fire cultivator

2020 ◽  
pp. 35-37
Author(s):  
A.-M. S. Dzhasheev ◽  
Keyword(s):  
New Technique ◽  
Soil Preparation ◽  
A New Technique ◽  
And Performance

A new technique for the soil preparation in film greenhouses for sowing small seeds of seedling crops using a fire cultivator for greenhouses is de-scribed. Specifications and performance of the OKT-1 greenhouse fire cultivator are provided.

3D Determination of Grain Shape in FeAl by Focused Ion Beam (FIB) Tomography

2001 ◽  
Vol 7 (S2) ◽  
pp. 936-937 ◽  
Author(s):  
B.J. Inkson ◽  
G. Mobus
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Sample Surface ◽  
Atom Probe ◽  
New Technique ◽  
3D Analysis ◽  
Specific Analysis ◽  
A New Technique ◽  
And Performance ◽  
Individual Grains

Techniques for the 3D analysis of materials at the sub-micron level are of major importance for understanding the structure and performance of new nanoengineered materials. Established techniques for determining 3D shapes of individual grains include X-ray tomography and light microscopy for grains ≫ 1μm, and 3D-atom probe for conducting grains < 50nm size. A new technique of TEM EELS tomography is being developed for particles 2-300nm in a chemically distinct matrix.For the grain size range 200nm-20μm, we have applied a new technique of 3D analysis using focused ion beam (FIB) sectioning to the site-specific analysis of the shape of individual grains in a single phase matrix. in the 3D FIB technique, a sample surface may be serially sectioned using a highly focused beam of Ga+ ions (Fig. 1). A sequential set of 2D secondary electron images through the sample can be aligned in 3D by cross-correlation of the position of reference markers in the 2D images.

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