Probing Wave Functions of Electrically Active Shallow Level Defects by Means of High-Frequency Pulsed ENDOR in Wide Bandgap Materials: SiC, AlN, ZnO, and AgCl
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2005 ◽
Vol 48
(3-4)
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pp. 487-499
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2013 ◽
Vol 24
(11)
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pp. 1575-1581
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2014 ◽
Vol 56
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pp. 011001
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