Probing Wave Functions of Electrically Active Shallow Level Defects by Means of High-Frequency Pulsed ENDOR in Wide Bandgap Materials: SiC, AlN, ZnO, and AgCl

Author(s):  
S. B. Orlinskii ◽  
V. A. Soltamov ◽  
G. V. Mamin ◽  
O. G. Poluektov ◽  
J. Schmidt ◽  
...  
2013 ◽  
Vol 24 (11) ◽  
pp. 1575-1581 ◽  
Author(s):  
Hee-Dong Kim ◽  
Ho-Myoung An ◽  
Kyoung Heon Kim ◽  
Su Jin Kim ◽  
Chi Sun Kim ◽  
...  

2020 ◽  
Vol MA2020-02 (26) ◽  
pp. 1809-1809
Author(s):  
Mark S. Goorsky ◽  
Patrick E Hopkins ◽  
Tengfei Luo ◽  
Asegun Henry ◽  
Samuel Graham ◽  
...  

2020 ◽  
Vol 30 (43) ◽  
pp. 2004655
Author(s):  
Tuan‐Anh Pham ◽  
Tuan‐Khoa Nguyen ◽  
Raja Kumar Vadivelu ◽  
Toan Dinh ◽  
Afzaal Qamar ◽  
...  

2003 ◽  
Vol 1 (2) ◽  
pp. 213-218
Author(s):  
M. Godlewski ◽  
J. Szmidt ◽  
A. Olszyna ◽  
A. Werbowy ◽  
E. Łusakowska ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document