On the Signorini’s Contact Problem with Non-local Coulomb’s Friction in Thermo-Piezoelectricity

2019 ◽  
Vol 169 (1) ◽  
pp. 33-58
Author(s):  
Hicham Benaissa ◽  
El-Hassan Benkhira ◽  
Rachid Fakhar ◽  
Abdelhadi Hachlaf
Keyword(s):  
Contact Problem ◽  
Coulomb’S Friction ◽  
Non Local

scholarly journals Analysis of a Unilateral Contact Problem with Normal Compliance

2014 ◽  
Vol 52 (1) ◽  
Author(s):  
Arezki Touzaline ◽  
Rachid Guettaf
Keyword(s):  
Contact Problem ◽  
Order Differential Equation ◽  
Uniqueness Result ◽  
Unilateral Contact ◽  
Normal Compliance ◽  
Mechanical Problem ◽  
First Order ◽  
Coulomb’S Friction ◽  
The Coefficient Of Friction ◽  
Nonlinear Elastic

AbstractThe paper deals with the study of a quasistatic unilateral contact problem between a nonlinear elastic body and a foundation. The contact is modelled with a normal compliance condition associated to unilateral constraint and the Coulomb's friction law. The adhesion between contact surfaces is taken into account and is modelled with a surface variable, the bonding field, whose evolution is described by a first-order differential equation. We establish a variational formulation of the mechanical problem and prove an existence and uniqueness result in the case where the coefficient of friction is bounded by a certain constant. The technique of the proof is based on arguments of time-dependent variational inequalities, differential equations and fixed-point theorem.

Toward High-Resolution Low-Voltage SEM

1988 ◽  
Vol 46 ◽  
pp. 218-219
Author(s):  
Zhifeng Shao
Keyword(s):  
Low Voltage ◽  
Spherical Aberration ◽  
Chromatic Aberration ◽  
Limiting Factor ◽  
Operating Voltage ◽  
Probe Radius ◽  
Non Local ◽  
Electron Microscopes ◽  
Image Position ◽  
Scanning Electron Microscopes

Recently, low voltage (≤5kV) scanning electron microscopes have become popular because of their unprecedented advantages, such as minimized charging effects and smaller specimen damage, etc. Perhaps the most important advantage of LVSEM is that they may be able to provide ultrahigh resolution since the interaction volume decreases when electron energy is reduced. It is obvious that no matter how low the operating voltage is, the resolution is always poorer than the probe radius. To achieve 10Å resolution at 5kV (including non-local effects), we would require a probe radius of 5∽6 Å. At low voltages, we can no longer ignore the effects of chromatic aberration because of the increased ratio δV/V. The 3rd order spherical aberration is another major limiting factor. The optimized aperture should be calculated as

Chromatic aberration and low-voltage SEM

1987 ◽  
Vol 45 ◽  
pp. 546-547
Author(s):  
Zhifeng Shao ◽  
A.V. Crewe
Keyword(s):  
Electron Energy ◽  
Low Voltage ◽  
Spherical Aberration ◽  
Chromatic Aberration ◽  
Primary Electron ◽  
Probe Size ◽  
Non Local ◽  
Optical Treatment ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes

For scanning electron microscopes, it is plausible that by lowering the primary electron energy, one can decrease the volume of interaction and improve resolution. As shown by Crewe /1/, at V0 =5kV a 10Å resolution (including non-local effects) is possible. To achieve this, we would need a probe size about 5Å. However, at low voltages, the chromatic aberration becomes the major concern even for field emission sources. In this case, δV/V = 0.1 V/5kV = 2x10-5. As a rough estimate, it has been shown that /2/ the chromatic aberration δC should be less than ⅓ of δ0 the probe size determined by diffraction and spherical aberration in order to neglect its effect. But this did not take into account the distribution of electron energy. We will show that by using a wave optical treatment, the tolerance on the chromatic aberration is much larger than we expected.

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