scholarly journals Thin Domain Walls in Lyra Geometry

2006 ◽  
Vol 305 (4) ◽  
pp. 337-340 ◽  
Author(s):  
F. Rahaman ◽  
M. Kalam ◽  
R. Mondal
Keyword(s):  
Domain Walls ◽  
Lyra Geometry ◽  
Thin Domain

A Xially Symmetric Cosmic Strings and Domain Walls in Lyra Geometry

2006 ◽  
Vol 302 (1-4) ◽  
pp. 157-160 ◽  
Author(s):  
D. R. K. Reddy ◽  
M. V. Subba Rao
Keyword(s):  
Domain Walls ◽  
Cosmic Strings ◽  
Lyra Geometry

scholarly journals String Cloud and Domain Walls with Quark Matter in Lyra Geometry

2012 ◽  
Vol 03 (10) ◽  
pp. 1479-1486 ◽  
Author(s):  
Kamal Lochan Mahanta ◽  
Ashwini Kumar Biswal
Keyword(s):  
Quark Matter ◽  
Domain Walls ◽  
Lyra Geometry

Domain walls in Lyra geometry

2003 ◽  
Vol 288 (4) ◽  
pp. 493-501 ◽  
Author(s):  
F. Rahaman ◽  
R. Mukherji
Keyword(s):  
Domain Walls ◽  
Lyra Geometry

Thin domain walls in YBa2Cu3O7−x: An X-ray diffraction study

1994 ◽  
Vol 235-240 ◽  
pp. 1265-1266 ◽  
Author(s):  
Jutta Chrosch ◽  
Ekhard KH Salje
Keyword(s):  
Diffraction Study ◽  
Domain Walls ◽  
Thin Domain ◽  
X Ray Diffraction ◽  
X Ray

The direct determination of magnetic domain wall profiles using a split detector STEM

1978 ◽  
Vol 36 (1) ◽  
pp. 466-467
Author(s):  
J.N. Chapman ◽  
P.E. Batson ◽  
E.M. Waddell ◽  
R.P. Ferrier
Keyword(s):  
Electron Microscope ◽  
Domain Wall ◽  
Transmission Electron Microscope ◽  
Domain Walls ◽  
Photographic Plate ◽  
Magnetic Domain ◽  
Direct Determination ◽  
Quantitative Information ◽  
Scanning Transmission Electron Microscope ◽  
Transmission Electron

By far the most commonly used mode of Lorentz microscopy in the examination of ferromagnetic thin films is the Fresnel or defocus mode. Use of this mode in the conventional transmission electron microscope (CTEM) is straightforward and immediately reveals the existence of all domain walls present. However, if such quantitative information as the domain wall profile is required, the technique suffers from several disadvantages. These include the inability to directly observe fine image detail on the viewing screen because of the stringent illumination coherence requirements, the difficulty of accurately translating part of a photographic plate into quantitative electron intensity data, and, perhaps most severe, the difficulty of interpreting this data. One solution to the first-named problem is to use a CTEM equipped with a field emission gun (FEG) (Inoue, Harada and Yamamoto 1977) whilst a second is to use the equivalent mode of image formation in a scanning transmission electron microscope (STEM) (Chapman, Batson, Waddell, Ferrier and Craven 1977), a technique which largely overcomes the second-named problem as well.

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