Large electric field-induced strain near AFE/FE phase boundary in (Pb0.97La0.02)(Zr, Sn, Ti)O3 system

2013 ◽  
Vol 48 (18) ◽  
pp. 6218-6222 ◽  
Author(s):  
Q. F. Zhang ◽  
T. Q. Yang ◽  
J. F. Wang
2018 ◽  
Vol 44 (3) ◽  
pp. 3211-3217 ◽  
Author(s):  
Pengyuan Fan ◽  
Yangyang Zhang ◽  
Bing Xie ◽  
Yiwei Zhu ◽  
Weigang Ma ◽  
...  

2008 ◽  
Vol 93 (24) ◽  
pp. 242903 ◽  
Author(s):  
Makoto Izumi ◽  
Katsuya Yamamoto ◽  
Muneyasu Suzuki ◽  
Yuji Noguchi ◽  
Masaru Miyayama

Open Physics ◽  
2005 ◽  
Vol 3 (2) ◽  
Author(s):  
Xi Yang ◽  
Andrew Beckwith ◽  
Mikhail Strikovski

AbstractWe deposited epitaxial thin films of Morphotropic Phase Boundary (MPB) Pb0.65Ba0.35Nb2O6 (PBN:65) on MgO substrates using pulsed laser deposition. Afterwards, a novel transmission optical experiment was developed to measure the electric field-induced bending angle of the thin film sample using a divergent incident light. From which the electric field-induced strain was obtained, and it was used to calculate the electrostrictive constant of the PBN thin film. The result is 0.000875 μm2/V2, and it is consistent with what we measured in the reflection experiment


2020 ◽  
Vol 197 ◽  
pp. 1-9 ◽  
Author(s):  
Jianguo Chen ◽  
John E. Daniels ◽  
Jie Jian ◽  
Zhenxiang Cheng ◽  
Jinrong Cheng ◽  
...  

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