scholarly journals Pulsed laser deposition of a PBN:65 morphotropic phase boundary thin film with large electrostriction

Open Physics ◽  
2005 ◽  
Vol 3 (2) ◽  
Author(s):  
Xi Yang ◽  
Andrew Beckwith ◽  
Mikhail Strikovski

AbstractWe deposited epitaxial thin films of Morphotropic Phase Boundary (MPB) Pb0.65Ba0.35Nb2O6 (PBN:65) on MgO substrates using pulsed laser deposition. Afterwards, a novel transmission optical experiment was developed to measure the electric field-induced bending angle of the thin film sample using a divergent incident light. From which the electric field-induced strain was obtained, and it was used to calculate the electrostrictive constant of the PBN thin film. The result is 0.000875 μm2/V2, and it is consistent with what we measured in the reflection experiment

2012 ◽  
Vol 1454 ◽  
pp. 183-188 ◽  
Author(s):  
Krishnaprasad Sasi ◽  
Sebastian Mailadil ◽  
Fredy Rojas ◽  
Aldrin Antony ◽  
Jayaraj Madambi

ABSTRACTBi1.5Zn1Nb1.5O7 (BZN) epitaxial thin films were prepared on Al2O3with a double ZnO buffer layer by pulsed laser deposition. The pole figure analysis and reciprocal space mapping revealed the single crystalline nature of the thin film. The sharp intense spots in the SAED pattern also indicates the highly crystalline nature of BZN thin film. The electrical properties of the as deposited thin films were investigated by patterning an inter digital capacitor (IDC) structure on BZN. A high tunability was observed in this epitaxially grown thin films.


2004 ◽  
Vol 79 (4-6) ◽  
pp. 807-809 ◽  
Author(s):  
C. Hirose ◽  
Y. Matsumoto ◽  
Y. Yamamoto ◽  
H. Koinuma

2003 ◽  
Vol 82 (13) ◽  
pp. 2026-2028 ◽  
Author(s):  
S. Yano ◽  
R. Schroeder ◽  
H. Sakai ◽  
B. Ullrich

2000 ◽  
Vol 76 (18) ◽  
pp. 2490-2492 ◽  
Author(s):  
P. A. Atanasov ◽  
R. I. Tomov ◽  
J. Perriére ◽  
R. W. Eason ◽  
N. Vainos ◽  
...  

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