Measurements of dielectric properties of TiO2 thin films at microwave frequencies using an extended cavity perturbation technique

Journal of Materials Science Materials in Electronics ◽

10.1007/s10854-009-9999-8 ◽

2009 ◽

Vol 21 (8) ◽

pp. 817-821 ◽

Author(s):

Jyh Sheen ◽

Chueh-Yu Li ◽

Liang-Wen Ji ◽

Wei-Lung Mao ◽

Weihsing Liu ◽

...

Keyword(s):

Dielectric Properties ◽

Perturbation Technique ◽

Tio2 Thin Films ◽

Microwave Frequencies ◽

Cavity Perturbation ◽

Extended Cavity

Download Full-text

Measurements of Microwave Dielectric Properties of (1-x)TiO2-xCaTiO3 and (1-x)TiO2-xSrTiO3 thin Films By The Cavity Perturbation Method

Journal of Electromagnetic Waves and Applications ◽

10.1163/156939311797453962 ◽

2011 ◽

Vol 25 (13) ◽

pp. 1886-1894 ◽

Author(s):

J. Sheen ◽

C.-Y. Li ◽

S.-W. Lin

Keyword(s):

Dielectric Properties ◽

Perturbation Method ◽

Microwave Dielectric Properties ◽

Microwave Dielectric ◽

Cavity Perturbation

Download Full-text

Extended cavity perturbation technique to determine the complex permittivity of dielectric materials

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/22.473190 ◽

1995 ◽

Vol 43 (11) ◽

pp. 2633-2636 ◽

Author(s):

Binshen Meng ◽

J. Booske ◽

R. Cooper

Keyword(s):

Complex Permittivity ◽

Perturbation Technique ◽

Dielectric Materials ◽

Cavity Perturbation ◽

Extended Cavity

Download Full-text

Amendment of cavity perturbation technique for loss tangent measurement at microwave frequencies

Journal of Applied Physics ◽

10.1063/1.2751484 ◽

2007 ◽

Vol 102 (1) ◽

pp. 014102 ◽

Author(s):

Jyh Sheen

Keyword(s):

Loss Tangent ◽

Perturbation Technique ◽

Microwave Frequencies ◽

Cavity Perturbation

Download Full-text

Dielectric Properties of Foods at 3 GHz as Determined by a Cavity Perturbation Technique.

Journal of Microwave Power ◽

10.1080/00222739.1971.11688789 ◽

1971 ◽

Vol 6 (2) ◽

pp. 107-123 ◽

Author(s):

N. E. Bengtsson ◽

P. O. Risman

Keyword(s):

Dielectric Properties ◽

Perturbation Technique ◽

Cavity Perturbation

Download Full-text

On the dielectric properties of dc magnetron TiO2 thin films

Applied Surface Science ◽

10.1016/s0169-4332(03)00624-x ◽

2003 ◽

Vol 218 (1-4) ◽

pp. 318-323 ◽

Author(s):

Marius D. Stamate

Keyword(s):

Dielectric Properties ◽

Tio2 Thin Films

Download Full-text

Measurement of Dielectric Parameters at Microwave Frequencies by Cavity-Perturbation Technique

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/tmtt.1979.1129731 ◽

1979 ◽

Vol 27 (9) ◽

pp. 791-795 ◽

Author(s):

A. Parkash ◽

J.K. Vaid ◽

A. Mansingh

Keyword(s):

Perturbation Technique ◽

Dielectric Parameters ◽

Microwave Frequencies ◽

Cavity Perturbation

Download Full-text

Effect of substrate bias voltage on the structure, electric and dielectric properties of TiO2 thin films by DC magnetron sputtering

Applied Surface Science ◽

10.1016/j.apsusc.2011.10.047 ◽

2011 ◽

Vol 258 (5) ◽

pp. 1789-1796 ◽

Author(s):

M. Chandra Sekhar ◽

P. Kondaiah ◽

S.V. Jagadeesh Chandra ◽

G. Mohan Rao ◽

S. Uthanna

Keyword(s):

Dielectric Properties ◽

Magnetron Sputtering ◽

Bias Voltage ◽

Substrate Bias ◽

Dc Magnetron Sputtering ◽

Tio2 Thin Films ◽

Substrate Bias Voltage

Download Full-text

High temperature dielectric properties of spent adsorbent with zinc sulfate by cavity perturbation technique

Journal of Hazardous Materials ◽

10.1016/j.jhazmat.2017.02.010 ◽

2017 ◽

Vol 330 ◽

pp. 36-45 ◽

Author(s):

Guo Lin ◽

Chenhui Liu ◽

Libo Zhang ◽

Tu Hu ◽

Jinhui Peng ◽

...

Keyword(s):

High Temperature ◽

Dielectric Properties ◽

Zinc Sulfate ◽

Perturbation Technique ◽

Cavity Perturbation

Download Full-text

Measurements of microwave dielectric properties by an amended cavity perturbation technique

Measurement ◽

10.1016/j.measurement.2008.03.017 ◽

2009 ◽

Vol 42 (1) ◽

pp. 57-61 ◽

Author(s):

Jyh Sheen

Keyword(s):

Dielectric Properties ◽

Perturbation Technique ◽

Microwave Dielectric Properties ◽

Microwave Dielectric ◽

Cavity Perturbation

Download Full-text

Dielectric measurements on substrate materials at microwave frequencies using a cavity perturbation technique

Journal of Applied Physics ◽

10.1063/1.341024 ◽

1988 ◽

Vol 63 (7) ◽

pp. 2466-2468 ◽

Author(s):

D. C. Dube ◽

M. T. Lanagan ◽

J. H. Kim ◽

S. J. Jang

Keyword(s):

Perturbation Technique ◽

Dielectric Measurements ◽

Microwave Frequencies ◽

Cavity Perturbation

Download Full-text