scholarly journals Developments in Time-Division Multiplexing of X-ray Transition-Edge Sensors

2015 ◽  
Vol 184 (1-2) ◽  
pp. 389-395 ◽  
Author(s):  
W. B. Doriese ◽  
K. M. Morgan ◽  
D. A. Bennett ◽  
E. V. Denison ◽  
C. P. Fitzgerald ◽  
...  
2016 ◽  
Vol 184 (1-2) ◽  
pp. 396-396 ◽  
Author(s):  
W. B. Doriese ◽  
K. M. Morgan ◽  
D. A. Bennett ◽  
E. V. Denison ◽  
C. P. Fitzgerald ◽  
...  

Author(s):  
Stephen J. Smith ◽  
Joseph S. Adams ◽  
Simon R. Bandler ◽  
James A. Chervenak ◽  
Aaron M. Datesman ◽  
...  

2008 ◽  
Vol 24 (1) ◽  
pp. 11-14 ◽  
Author(s):  
Masashi OHNO ◽  
Hiroyuki TAKAHASHI ◽  
R. M. Thushara DAMAYANTHI ◽  
Yasuhiro MINAMIKAWA ◽  
Fumiakira MORI

Author(s):  
Marcel P. Bruijn ◽  
Wouter M.Bergmann Tiest ◽  
Henk F.C. Hoevers ◽  
Eric Krouwer ◽  
Jan van der Kuur ◽  
...  

2013 ◽  
Vol 176 (3-4) ◽  
pp. 285-290 ◽  
Author(s):  
M. R. J. Palosaari ◽  
K. M. Kinnunen ◽  
J. Julin ◽  
M. Laitinen ◽  
M. Napari ◽  
...  

2020 ◽  
Vol 200 (5-6) ◽  
pp. 445-451
Author(s):  
S. Okada ◽  
T. Azuma ◽  
D. A. Bennett ◽  
P. Caradonna ◽  
W. B. Doriese ◽  
...  

2000 ◽  
Author(s):  
Caroline K. Stahle ◽  
Regis P. Brekosky ◽  
Enectali Figueroa-Feliciano ◽  
Fred M. Finkbeiner ◽  
John D. Gygax ◽  
...  

2019 ◽  
Vol 90 (11) ◽  
pp. 113101 ◽  
Author(s):  
Sang-Jun Lee ◽  
Charles J. Titus ◽  
Roberto Alonso Mori ◽  
Michael L. Baker ◽  
Douglas A. Bennett ◽  
...  

2003 ◽  
Vol 17 (04n06) ◽  
pp. 948-952 ◽  
Author(s):  
C. GANDINI ◽  
V. LACQUANITI ◽  
E. MONTICONE ◽  
C. PORTESI ◽  
M. RAJTERI ◽  
...  

Recently transition-edge sensors (TES) have obtained an increasing interest as light detectors due to their high energy resolution and broadband response. Titanium (Ti), with transition temperature up to 0.5 K, is among the suitable materials for TES application. In this work we investigate Ti films obtained from two materials of different purity deposited by e-gun on silicon nitride. Films with different thickness and deposition substrate temperature have been measured. Critical temperatures, electrical resistivities and structural properties obtained from x-ray are related to each other.


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