CORRELATION OF CRITICAL TEMPERATURES AND ELECTRICAL PROPERTIES IN TITANIUM FILMS
2003 ◽
Vol 17
(04n06)
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pp. 948-952
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Keyword(s):
X Ray
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Recently transition-edge sensors (TES) have obtained an increasing interest as light detectors due to their high energy resolution and broadband response. Titanium (Ti), with transition temperature up to 0.5 K, is among the suitable materials for TES application. In this work we investigate Ti films obtained from two materials of different purity deposited by e-gun on silicon nitride. Films with different thickness and deposition substrate temperature have been measured. Critical temperatures, electrical resistivities and structural properties obtained from x-ray are related to each other.
2017 ◽
Vol 139
(49)
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pp. 18024-18033
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2019 ◽
Vol 5
(02)
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pp. 1
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