Analysis of Double Gaussian Distribution at the Interface of Ni/Ta2O5/P-Si Schottky Barrier Diodes Using Temperature Dependent Current-Voltage (I-V) Measurements

Silicon ◽  
2020 ◽  
Author(s):  
Nallabala Nanda Kumar Reddy ◽  
Chandramohan Kukkambakam ◽  
V. Manjunath ◽  
Vasudeva Reddy Minnam Reddy
2015 ◽  
Vol 650 ◽  
pp. 658-663 ◽  
Author(s):  
Zagarzusem Khurelbaatar ◽  
Min-Sung Kang ◽  
Kyu-Hwan Shim ◽  
Hyung-Joong Yun ◽  
Jouhan Lee ◽  
...  

2013 ◽  
Vol 43 (1-2) ◽  
pp. 13-21 ◽  
Author(s):  
Y. Munikrishana Reddy ◽  
M. K. Nagaraj ◽  
M. Siva Pratap Reddy ◽  
Jung-Hee Lee ◽  
V. Rajagopal Reddy

2011 ◽  
Author(s):  
N. Nanda Kumar Reddy ◽  
I. Jyothi ◽  
V. Rajagopal Reddy ◽  
Alka B. Garg ◽  
R. Mittal ◽  
...  

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