scholarly journals Overlap graphs and de Bruijn graphs: data structures for de novo genome assembly in the big data era

2019 ◽  
Vol 7 (4) ◽  
pp. 278-292 ◽  
Author(s):  
Raffaella Rizzi ◽  
Stefano Beretta ◽  
Murray Patterson ◽  
Yuri Pirola ◽  
Marco Previtali ◽  
...  
Author(s):  
A. A. Sergushichev ◽  
◽  
A. V. Alexandrov ◽  
S. V. Kazakov ◽  
F. N. Tsarev ◽  
...  

2014 ◽  
Vol 9 (8) ◽  
Author(s):  
Mohammad Ibrahim Khan ◽  
Md Sarwar Kamal

GigaScience ◽  
2016 ◽  
Vol 5 (1) ◽  
Author(s):  
Xuewei Li ◽  
Ling Kui ◽  
Jing Zhang ◽  
Yinpeng Xie ◽  
Liping Wang ◽  
...  

PLoS ONE ◽  
2011 ◽  
Vol 6 (8) ◽  
pp. e23501 ◽  
Author(s):  
Jarrod A. Chapman ◽  
Isaac Ho ◽  
Sirisha Sunkara ◽  
Shujun Luo ◽  
Gary P. Schroth ◽  
...  

2021 ◽  
Author(s):  
Minxuan Zhou ◽  
Lingxi Wu ◽  
Muzhou Li ◽  
Niema Moshiri ◽  
Kevin Skadron ◽  
...  

PeerJ ◽  
2019 ◽  
Vol 7 ◽  
pp. e6902 ◽  
Author(s):  
Simon Roux ◽  
Gareth Trubl ◽  
Danielle Goudeau ◽  
Nandita Nath ◽  
Estelle Couradeau ◽  
...  

Background Metagenomics has transformed our understanding of microbial diversity across ecosystems, with recent advances enabling de novo assembly of genomes from metagenomes. These metagenome-assembled genomes are critical to provide ecological, evolutionary, and metabolic context for all the microbes and viruses yet to be cultivated. Metagenomes can now be generated from nanogram to subnanogram amounts of DNA. However, these libraries require several rounds of PCR amplification before sequencing, and recent data suggest these typically yield smaller and more fragmented assemblies than regular metagenomes. Methods Here we evaluate de novo assembly methods of 169 PCR-amplified metagenomes, including 25 for which an unamplified counterpart is available, to optimize specific assembly approaches for PCR-amplified libraries. We first evaluated coverage bias by mapping reads from PCR-amplified metagenomes onto reference contigs obtained from unamplified metagenomes of the same samples. Then, we compared different assembly pipelines in terms of assembly size (number of bp in contigs ≥ 10 kb) and error rates to evaluate which are the best suited for PCR-amplified metagenomes. Results Read mapping analyses revealed that the depth of coverage within individual genomes is significantly more uneven in PCR-amplified datasets versus unamplified metagenomes, with regions of high depth of coverage enriched in short inserts. This enrichment scales with the number of PCR cycles performed, and is presumably due to preferential amplification of short inserts. Standard assembly pipelines are confounded by this type of coverage unevenness, so we evaluated other assembly options to mitigate these issues. We found that a pipeline combining read deduplication and an assembly algorithm originally designed to recover genomes from libraries generated after whole genome amplification (single-cell SPAdes) frequently improved assembly of contigs ≥10 kb by 10 to 100-fold for low input metagenomes. Conclusions PCR-amplified metagenomes have enabled scientists to explore communities traditionally challenging to describe, including some with extremely low biomass or from which DNA is particularly difficult to extract. Here we show that a modified assembly pipeline can lead to an improved de novo genome assembly from PCR-amplified datasets, and enables a better genome recovery from low input metagenomes.


2021 ◽  
Vol 22 (1) ◽  
Author(s):  
Yu Chen ◽  
Yixin Zhang ◽  
Amy Y. Wang ◽  
Min Gao ◽  
Zechen Chong

AbstractLong-read de novo genome assembly continues to advance rapidly. However, there is a lack of effective tools to accurately evaluate the assembly results, especially for structural errors. We present Inspector, a reference-free long-read de novo assembly evaluator which faithfully reports types of errors and their precise locations. Notably, Inspector can correct the assembly errors based on consensus sequences derived from raw reads covering erroneous regions. Based on in silico and long-read assembly results from multiple long-read data and assemblers, we demonstrate that in addition to providing generic metrics, Inspector can accurately identify both large-scale and small-scale assembly errors.


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