Shape effects on crystallite size distributions in synthetic hematites from X-ray line-profile analysis

1980 ◽  
Vol 34 (3) ◽  
pp. 323-333 ◽  
Author(s):  
P.H. Duvigneaud ◽  
R. Derie
Keyword(s):  
Crystallite Size ◽  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Size Distributions ◽  
X Ray ◽  
Shape Effects

Dislocation densities and crystallite size distributions in nanocrystalline ball-milled fluorides,MF2(M= Ca, Sr, Ba and Cd), determined by X-ray diffraction line-profile analysis

2005 ◽  
Vol 38 (6) ◽  
pp. 912-926 ◽  
Author(s):  
G. Ribárik ◽  
N. Audebrand ◽  
H. Palancher ◽  
T. Ungár ◽  
D. Louër
Keyword(s):  
Crystallite Size ◽  
Line Profile ◽  
Interference Effect ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Size Distributions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Dislocation Densities

The dislocation densities and crystallite size distributions in ball-milled fluorides,MF2(M= Ca, Sr, Ba and Cd), of the fluorite structure type have been determined as a function of milling time by X-ray diffraction line-profile analysis. The treatment has been based on the concept of dislocation contrast to explain strain anisotropy by means of the modified Williamson–Hall and Warren–Averbach approaches and a whole-profile fitting method using physically based functions. In most cases, the measured and calculated patterns are in perfect agreement; however, in some specific cases, the first few measured profiles appear to be narrower than the calculated ones. This discrepancy is interpreted as the result of an interference effect similar to that described by Rafaja, Klemm, Schreiber, Knapp & Kužel [J. Appl. Cryst.(2004),37, 613–620]. By taking into account and correcting for this interference effect, the microstructure of ball-milled fluorides is determined in terms of dislocation structure and size distributions of coherent domains. A weak coalescence of the crystallites is observed at longer milling periods. An incubation period in the evolution of microstrains is in correlation with the homologous temperatures of the fluorides.

scholarly journals Investigations on Microstructural and Layer Disorder Parameters of Na-Montmorillonite-Glycine Intercalation Compounds

2012 ◽  
Vol 60 (1) ◽  
pp. 25-29 ◽  
Author(s):  
Adnan Hossain Khan ◽  
Parimal Bala ◽  
AFM Mustafizur Rahman ◽  
Mohammad Nurnabi
Keyword(s):  
Crystallite Size ◽  
Chain Length ◽  
Line Profile ◽  
Profile Analysis ◽  
Interlayer Spacing ◽  
Line Profile Analysis ◽  
X Ray ◽  
Microstructural Parameters ◽  
Silicate Layers ◽  
Layer Disorder

Glycine-Montmorillonite (Gly-MMT) composite has been synthesized through intercalation process using Na-Montmorillonite (Na- MMT) and glycine ethylester hydrochloride. Gly-MMT was employed for the synthesis of dipeptide (Gly-Gly-MMT). Microstructural parameters such as crystallite size, r.m.s. strain (<e2>1/2) and layer disorder parameters such as variation of interlayer spacing (g) and proportion of planes affected by such defects (?) of the samples have been calculated by X-ray line profile analysis. In comparison to Na-MMT the basal spacings (d001) of Gly-MMT and Gly-Gly-MMT were reduced by 2.4Å and 1.8Å respectively. The value of d001 of Gly-Gly-MMT (13.3 Å) suggests the monolayer orientation of dipeptide into interlayer spaces. It is also suggested that more homogeneity in the stacking of silicate layers is attained in Gly-Gly-MMT due to the increased chain length of the dipeptide and orientation in monolayer style.DOI: http://dx.doi.org/10.3329/dujs.v60i1.10331Dhaka Univ. J. Sci. 60(1): 25-29, 2012 (January)

Practical Applications of X-Ray Line Profile Analysis

2017 ◽  
pp. 1094-1132
Author(s):  
Jenő Gubicza
Keyword(s):  
Crystallite Size ◽  
Twin Boundary ◽  
Line Profile ◽  
Profile Analysis ◽  
Vacancy Concentration ◽  
Direct Method ◽  
Line Profile Analysis ◽  
Line Profiles ◽  
X Ray ◽  
Practical Applications

In the previous chapters, the theory and the main methods of diffraction peak profile analysis were presented. Additionally, the specialties in the measurement and the evaluation of line profiles in the cases of thin films and single crystals were discussed. In this chapter, some practical considerations are given in order to facilitate the evaluation of peak profiles and the interpretation of the results obtained by this method. For instance, the procedures for instrumental correction are overviewed. Additionally, how the prevailing dislocation slip systems and twin boundary types in hexagonal polycrystals can be determined from line profiles is shown. Besides the dislocation density, the vacancy concentration can also be obtained by the combination of electrical resistivity, calorimetric, and line profile measurements. The crystallite size and the twin boundary frequency determined by X-ray peak profile analysis are compared with the values obtained by the direct method of transmission electron microscopy. Furthermore, the limits of line profile analysis in the determination of crystallite size and defect densities are given. Finally, short overviews on the results obtained by peak profile analysis for metals, ceramics, and polymers are presented.

Practical Applications of X-Ray Line Profile Analysis

2014 ◽  
pp. 271-318
Keyword(s):  
Crystallite Size ◽  
Twin Boundary ◽  
Line Profile ◽  
Profile Analysis ◽  
Vacancy Concentration ◽  
Direct Method ◽  
Line Profile Analysis ◽  
Line Profiles ◽  
X Ray ◽  
Practical Applications

In the previous chapters, the theory and the main methods of diffraction peak profile analysis were presented. Additionally, the specialties in the measurement and the evaluation of line profiles in the cases of thin films and single crystals were discussed. In this chapter, some practical considerations are given in order to facilitate the evaluation of peak profiles and the interpretation of the results obtained by this method. For instance, the procedures for instrumental correction are overviewed. Additionally, how the prevailing dislocation slip systems and twin boundary types in hexagonal polycrystals can be determined from line profiles is shown. Besides the dislocation density, the vacancy concentration can also be obtained by the combination of electrical resistivity, calorimetric, and line profile measurements. The crystallite size and the twin boundary frequency determined by X-ray peak profile analysis are compared with the values obtained by the direct method of transmission electron microscopy. Furthermore, the limits of line profile analysis in the determination of crystallite size and defect densities are given. Finally, short overviews on the results obtained by peak profile analysis for metals, ceramics, and polymers are presented.

scholarly journals Fundamental Parameter Method Applied to X-Ray Line Profile Analysis

2016 ◽  
Vol 73 (2) ◽  
pp. 310
Author(s):  
Florica Matei ◽  
Nicolae Aldea ◽  
Marius Rada ◽  
Ioana Pop
Keyword(s):  
Crystallite Size ◽  
Line Profile ◽  
Profile Analysis ◽  
Distribution Functions ◽  
Parameter Method ◽  
Strain Effect ◽  
Line Profile Analysis ◽  
Fundamental Parameter ◽  
X Ray ◽  
Fundamental Parameter Method

Crystallite size strain effect the mechanical, electric, magnetic and optical properties of many kind of the nanomaterials. The effects of the finite crystallite size and lattice strain can be very well observed as the deformation in the shape of the X-ray line profile (XRLP). In this contribution we have used the fundamental parameter (FP) [1,2] method to evaluate the nanostructure materials assuming a theoretical model of experimental XRLP.  In this contribution we have used various distribution functions such as normal, lognormal, Gumbel, Maxwell and Student. The best values of the crystallite size of nanostructued materials are chosen by analysis of root mean squares of residuals and by correlation matrix of the fit parameters. The entire procedure was implemented in the GnuPlot script. 

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