Optimal design of accelerated life tests for the Weibull distribution under periodic inspection and type I censoring

Microelectronics Reliability ◽

10.1016/0026-2714(94)90453-7 ◽

1994 ◽

Vol 34 (9) ◽

pp. 1459-1468 ◽

Author(s):

A. Islam ◽

N. Ahmad

Keyword(s):

Optimal Design ◽

Weibull Distribution ◽

Type I ◽

Periodic Inspection ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Download Full-text

Inference and Optimal Design Based on Step—Partially Accelerated Life Tests for the Generalized Pareto Distribution under Progressive Type-I Censoring

Communications in Statistics - Simulation and Computation ◽

10.1080/03610918.2013.826363 ◽

2014 ◽

Vol 44 (7) ◽

pp. 1750-1769 ◽

Author(s):

Alaa H. Abdel-Hamid ◽

Essam K. Al-Hussaini

Keyword(s):

Optimal Design ◽

Pareto Distribution ◽

Generalized Pareto Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Generalized Pareto ◽

Accelerated Life ◽

Progressive Type ◽

Download Full-text

Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring

Microelectronics Reliability ◽

10.1016/0026-2714(93)90418-x ◽

1993 ◽

Vol 33 (13) ◽

pp. 2065

Keyword(s):

Optimal Design ◽

Exponential Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Download Full-text

Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring

IEEE Transactions on Reliability ◽

10.1109/24.159807 ◽

1992 ◽

Vol 41 (3) ◽

pp. 400-406 ◽

Author(s):

D.S. Bai ◽

S.W. Chung

Keyword(s):

Optimal Design ◽

Exponential Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Download Full-text

Optimum simple step-stress accelerated life tests for weibull distribution and type I censoring

Naval Research Logistics (NRL) ◽

10.1002/1520-6750(199303)40:2<193::aid-nav3220400205>3.0.co;2-j ◽

1993 ◽

Vol 40 (2) ◽

pp. 193-210 ◽

Author(s):

Do Sun Bai ◽

Myung Soo Kim

Keyword(s):

Weibull Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Simple Step ◽

Download Full-text

Classical and Bayesian Inferences in Step-Stress Partially Accelerated Life Tests for Inverse Weibull Distribution Under Type-I Censoring

Strength of Materials ◽

10.1007/s11223-020-00200-y ◽

2020 ◽

Vol 52 (3) ◽

pp. 480-496

Author(s):

F. G. Akgul ◽

K. Yu ◽

B. Senoglu

Keyword(s):

Weibull Distribution ◽

Type I ◽

Bayesian Inferences ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Inverse Weibull Distribution ◽

Download Full-text

Optimal design of partially accelerated life tests for the lognormal distribution under type I censoring

Reliability Engineering & System Safety ◽

10.1016/0951-8320(93)90122-f ◽

1993 ◽

Vol 40 (1) ◽

pp. 85-92 ◽

Author(s):

D.S. Bai ◽

S.W. Chung ◽

Y.R. Chun

Keyword(s):

Optimal Design ◽

Lognormal Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Download Full-text

Optimal three step stress accelerated life tests under periodic inspection and type I censoring

Journal of the Korean Data and Information Science Society ◽

10.7465/jkdi.2012.23.4.843 ◽

2012 ◽

Vol 23 (4) ◽

pp. 843-850 ◽

Author(s):

Gyoung-Ae Moon

Keyword(s):

Type I ◽

Periodic Inspection ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Download Full-text

Optimal design of cyclic-stress accelerated life tests for lognormal lifetime distribution under type I censoring

Microelectronics Reliability ◽

10.1016/j.microrel.2021.114315 ◽

2021 ◽

pp. 114315

Author(s):

Seung-Hyun Kim ◽

Si-Il Sung

Keyword(s):

Optimal Design ◽

Cyclic Stress ◽

Lifetime Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Download Full-text

Exact Confidence Limits for the Parameter of an Exponential Distribution in the Accelerated Life Tests under Type-I Censoring

Acta Mathematicae Applicatae Sinica English Series ◽

10.1007/s10255-021-1021-0 ◽

2021 ◽

Vol 37 (2) ◽

pp. 393-408

Author(s):

De-qiang Zheng ◽

Xiang-zhong Fang

Keyword(s):

Exponential Distribution ◽

Type I ◽

Confidence Limits ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Download Full-text

Optimal design of accelerated life tests under periodic inspection

Naval Research Logistics (NRL) ◽

10.1002/1520-6750(198912)36:6<779::aid-nav3220360604>3.0.co;2-2 ◽

1989 ◽

Vol 36 (6) ◽

pp. 779-795 ◽

Author(s):

Bong-Jin Yum ◽

Seung-Cheol Choi

Keyword(s):

Optimal Design ◽

Periodic Inspection ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Download Full-text