Inference and Optimal Design Based on Step—Partially Accelerated Life Tests for the Generalized Pareto Distribution under Progressive Type-I Censoring

Communications in Statistics - Simulation and Computation ◽

10.1080/03610918.2013.826363 ◽

2014 ◽

Vol 44 (7) ◽

pp. 1750-1769 ◽

Author(s):

Alaa H. Abdel-Hamid ◽

Essam K. Al-Hussaini

Keyword(s):

Optimal Design ◽

Pareto Distribution ◽

Generalized Pareto Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Generalized Pareto ◽

Accelerated Life ◽

Progressive Type ◽

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Estimation in K-Stage Step-Stress Partially Accelerated Life Tests for Generalized Pareto Distribution with Progressive Type-I Censoring

Applied Mathematics & Information Sciences ◽

10.18576/amis/150307 ◽

2021 ◽

Vol 15 (3) ◽

pp. 299-305

Keyword(s):

Pareto Distribution ◽

Generalized Pareto Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Generalized Pareto ◽

Accelerated Life ◽

Progressive Type ◽

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Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring

Microelectronics Reliability ◽

10.1016/0026-2714(93)90418-x ◽

1993 ◽

Vol 33 (13) ◽

pp. 2065

Keyword(s):

Optimal Design ◽

Exponential Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

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Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring

IEEE Transactions on Reliability ◽

10.1109/24.159807 ◽

1992 ◽

Vol 41 (3) ◽

pp. 400-406 ◽

Author(s):

D.S. Bai ◽

S.W. Chung

Keyword(s):

Optimal Design ◽

Exponential Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

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On the Existence of the Optimal Step-Stress Accelerated Life Tests Under Progressive Type-I Censoring

IEEE Transactions on Reliability ◽

10.1109/tr.2019.2915773 ◽

2020 ◽

Vol 69 (3) ◽

pp. 903-915 ◽

Author(s):

David Han

Keyword(s):

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Progressive Type ◽

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Design of optimal step–stress accelerated life tests under progressive type I censoring with random removals

Quality & Quantity ◽

10.1007/s11135-010-9315-y ◽

2010 ◽

Vol 45 (3) ◽

pp. 587-597 ◽

Author(s):

Kuan-Fu Shen ◽

Yu-Jan Shen ◽

Lii-Yuh Leu

Keyword(s):

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Progressive Type ◽

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Comparison between constant-stress and step-stress accelerated life tests under a cost constraint for progressive type I censoring

Sequential Analysis ◽

10.1080/07474946.2021.1847940 ◽

2021 ◽

Vol 40 (1) ◽

pp. 17-31

Author(s):

Nooshin Hakamipour

Keyword(s):

Constant Stress ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Progressive Type ◽

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Optimal design of accelerated life tests for the Weibull distribution under periodic inspection and type I censoring

Microelectronics Reliability ◽

10.1016/0026-2714(94)90453-7 ◽

1994 ◽

Vol 34 (9) ◽

pp. 1459-1468 ◽

Author(s):

A. Islam ◽

N. Ahmad

Keyword(s):

Optimal Design ◽

Weibull Distribution ◽

Type I ◽

Periodic Inspection ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

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Optimal design of partially accelerated life tests for the lognormal distribution under type I censoring

Reliability Engineering & System Safety ◽

10.1016/0951-8320(93)90122-f ◽

1993 ◽

Vol 40 (1) ◽

pp. 85-92 ◽

Author(s):

D.S. Bai ◽

S.W. Chung ◽

Y.R. Chun

Keyword(s):

Optimal Design ◽

Lognormal Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

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Analysis and Optimum Plan for 3-Step Step-Stress Accelerated Life Tests with Lomax Model Under Progressive Type-I Censoring

Communications in Mathematics and Statistics ◽

10.1007/s40304-017-0123-8 ◽

2018 ◽

Vol 6 (1) ◽

pp. 73-90 ◽

Author(s):

N. Chandra ◽

Mashroor Ahmad Khan

Keyword(s):

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Progressive Type ◽

Optimum Plan ◽

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Optimal design of cyclic-stress accelerated life tests for lognormal lifetime distribution under type I censoring

Microelectronics Reliability ◽

10.1016/j.microrel.2021.114315 ◽

2021 ◽

pp. 114315

Author(s):

Seung-Hyun Kim ◽

Si-Il Sung

Keyword(s):

Optimal Design ◽

Cyclic Stress ◽

Lifetime Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

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