The University of Washington three-stage tandem Van de Graaff accelerator

1974 ◽  
Vol 122 ◽  
pp. 65-79 ◽  
Author(s):  
W.G. Weitkamp ◽  
F.H. Schmidt
Radiocarbon ◽  
1980 ◽  
Vol 22 (3) ◽  
pp. 838-849 ◽  
Author(s):  
G W Farwell ◽  
T P Schaad ◽  
F H Schmidt ◽  
M-Y B Tsang ◽  
P M Grootes ◽  
...  

The University of Washington Model FN tandem Van de Graaff accelerator is being used for the measurement of extremely small isotopic abundance ratios, notably 14C/12C and 10Be/9Be, in a joint project of the Nuclear Physics Laboratory (NPL) and the Quaternary Isotope Laboratory (QL). The experimental arrangements and technical developments are described, and some preliminary results on isotopic ratios in carbon and beryllium are presented.


1978 ◽  
Vol 150 (3) ◽  
pp. 407-416 ◽  
Author(s):  
V. Bechtold ◽  
L. Friedrich ◽  
P. Ziegler ◽  
R. Aniol ◽  
G. Latzel ◽  
...  

Radiocarbon ◽  
1980 ◽  
Vol 22 (3) ◽  
pp. 785-793 ◽  
Author(s):  
H E Gove ◽  
David Elmore ◽  
R D Ferraro ◽  
R P Beukens ◽  
K H Chang ◽  
...  

An MP tandem Van de Graaff accelerator at the University of Rochester has been employed since May 1977 to detect 14C in various terrestrial samples. The carbon sample sizes required are 1mg or less. Dating accuracies based on reproducibility now approach (± 80 years). Measurements have been made on 1850 wood, Australian sucrose, a carbon sample from Mt Shasta, a baby woolly mammoth, and an Egyptian bull mummy wrapping.


Author(s):  
K. F. Russell ◽  
L. L. Horton

Beams of heavy ions from particle accelerators are used to produce radiation damage in metal alloys. The damaged layer extends several microns below the surface of the specimen with the maximum damage and depth dependent upon the energy of the ions, type of ions, and target material. Using 4 MeV heavy ions from a Van de Graaff accelerator causes peak damage approximately 1 μm below the specimen surface. To study this area, it is necessary to remove a thickness of approximately 1 μm of damaged metal from the surface (referred to as “sectioning“) and to electropolish this region to electron transparency from the unirradiated surface (referred to as “backthinning“). We have developed electropolishing techniques to obtain electron transparent regions at any depth below the surface of a standard TEM disk. These techniques may be applied wherever TEM information is needed at a specific subsurface position.


2004 ◽  
Vol 171 (4S) ◽  
pp. 401-401
Author(s):  
Robert M. Sweet ◽  
Timothy Kowalewski ◽  
Peter Oppenheimer ◽  
Jeffrey Berkley ◽  
Suzanne Weghorst ◽  
...  

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