Determination of neutron generator fast neutron spectra using threshold detectors

1980 ◽  
Vol 178 (2-3) ◽  
pp. 451-458 ◽  
Author(s):  
Mervi Hyvönen-Dabek ◽  
Päivi Nikkinen-Vilkki
Keyword(s):  
Fast Neutron ◽  
Neutron Generator ◽  
Neutron Spectra

Determination of cyclotron fast neutron spectra and fluxes with activation detectors

Physica ◽  
1964 ◽  
Vol 30 (5) ◽  
pp. 978-984 ◽  
Author(s):  
I. Heertje ◽  
A.H.W. Aten
Keyword(s):  
Fast Neutron ◽  
Neutron Spectra

scholarly journals DETERMINATION OF LIMIT DETECTION OF THE ELEMENTS N, P, K, Si, Al, Fe, Cu, Cd, WITH FAST NEUTRON ACTIVATION USING NEUTRON GENERATOR

2010 ◽  
Vol 6 (2) ◽  
pp. 170-174
Author(s):  
Sunardi Sunardi ◽  
Muryono Muryono
Keyword(s):  
Neutron Activation ◽  
Fast Neutron ◽  
Gamma Spectrometry ◽  
Neutron Generator ◽  
Experimental Result ◽  
Activation Foil ◽  
Limit Detection ◽  
San Carlos ◽  
Made In

Determination of limit detection of the elements N, P, K, Si, Al, Fe, Cu, Cd, with fast neutron activation using neutron generator has been done.  Samples prepared from SRM 2704, N, P, K elements from MERCK, Cu, Cd, Al from activation foil made in San Carlos, weighted and packed for certain weight then iradiated during 30 minutes with 14 MeV fast neutron using the neutron generator and then counted with gamma spectrometry (accuspec).  At this research condition of neutron generator was set at current 1 mA that produced neutron flux about 5,47.107 n/cm2.s and  experimental result shown that the limit detection for the elements N, P, K, Si, Al, Fe, Cu, Cd are  2,44 ppm, 1,88 ppm, 2,15 ppm, 1,44 ppm, 1,26 ppm, 1,35 ppm, 1,05 ppm, 2,99 ppm, respectively.  The data  indicate that the limit detection or sensitivity of appliance of neutron generator to analyze the element is very good, which is feasible to get accreditation AANC laboratory using neutron generator.   Keywords: limit detection, AANC, neutron generator

Weak Beam Imaging and Diffraction Studies of Stacking Faults in Silicon

1976 ◽  
Vol 34 ◽  
pp. 590-591
Author(s):  
T. Y. Tan ◽  
W. K. Tice
Keyword(s):  
Fast Neutron ◽  
Rapid Determination ◽  
Stacking Faults ◽  
Imaging Method ◽  
Large Reduction ◽  
Dislocation Loops ◽  
Fringe Spacing ◽  
Weak Beam ◽  
Kinematical Theory

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.

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