Determination of cyclotron fast neutron spectra and fluxes with activation detectors

Physica ◽  
1964 ◽  
Vol 30 (5) ◽  
pp. 978-984 ◽  
Author(s):  
I. Heertje ◽  
A.H.W. Aten
Keyword(s):  
1980 ◽  
Vol 178 (2-3) ◽  
pp. 451-458 ◽  
Author(s):  
Mervi Hyvönen-Dabek ◽  
Päivi Nikkinen-Vilkki

Author(s):  
T. Y. Tan ◽  
W. K. Tice

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.


Fuel ◽  
1975 ◽  
Vol 54 (1) ◽  
pp. 70-71 ◽  
Author(s):  
Charles E. Hamrin ◽  
Peter S. Maa ◽  
Lindgren L. Chyi ◽  
William D. Ehmann

1979 ◽  
Vol 79 (2) ◽  
pp. 354-362 ◽  
Author(s):  
R.M. Yonco ◽  
V.A. Maroni ◽  
J.E. Strain ◽  
J.H. Devan

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