Atomic force microscopy and fourier transform infra-red studies of the influence of a highly oriented poly(tetrafluoroethylene) substrate on poly(ethylene terephthalate) overlayers

Polymer ◽  
1996 ◽  
Vol 37 (3) ◽  
pp. 523-526 ◽  
Author(s):  
N.W. Hayes ◽  
G. Beamson ◽  
D.T. Clark ◽  
D.T. Clarke ◽  
D.S.-L. Law
Keyword(s):  
Atomic Force Microscopy ◽  
Fourier Transform ◽  
Ethylene Terephthalate ◽  
Force Microscopy ◽  
Atomic Force ◽  
Poly Ethylene Terephthalate ◽  
Infra Red ◽  
Poly Ethylene

Surface reconstruction of UV-laser irradiated poly(ethylene terephthalate) by atomic force microscopy

1992 ◽  
Vol 59 (3-4) ◽  
pp. 267-271 ◽  
Author(s):  
Lothar Wefers ◽  
Dierk Knittel ◽  
Dirk Bosbach ◽  
Werner Rammensee ◽  
Eckhard Schollmeyer
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Reconstruction ◽  
Ethylene Terephthalate ◽  
Uv Laser ◽  
Force Microscopy ◽  
Atomic Force ◽  
Poly Ethylene Terephthalate ◽  
Poly Ethylene
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