Level of dangling bond centres and its broadening due to disorder in amorphous silicon as elucidated by optically detected magnetic resonance measurements

1982 ◽  
Vol 43 (10) ◽  
pp. 751-755 ◽  
Author(s):  
K. Morigaki ◽  
Y. Sano ◽  
I. Hirabayashi ◽  
M. Konagai ◽  
M. Suzuki
1982 ◽  
Vol 46 (5) ◽  
pp. 473-500 ◽  
Author(s):  
S. Depinna ◽  
B. C. Cavenett ◽  
I. G. Austin ◽  
T. M. Searle ◽  
M. J. Thompson ◽  
...  

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