Level of dangling bond centres and its broadening due to disorder in amorphous silicon as elucidated by optically detected magnetic resonance measurements
1982 ◽
Vol 43
(10)
◽
pp. 751-755
◽
1983 ◽
Vol 59-60
◽
pp. 357-360
◽
Keyword(s):
1982 ◽
Vol 46
(5)
◽
pp. 473-500
◽
1981 ◽
Vol 39
(9)
◽
pp. 947-951
◽
1988 ◽
Vol 57
(11)
◽
pp. 3858-3867
◽
1984 ◽
Vol 23
(Part 2, No. 8)
◽
pp. L593-L595
◽
1982 ◽
Vol 46
(5)
◽
pp. 501-513
◽
1982 ◽
Vol 43
(6)
◽
pp. 439-442
◽
1979 ◽
Vol 32
(9)
◽
pp. 795-799
◽
1991 ◽
Vol 137-138
◽
pp. 275-278
◽
1985 ◽
Vol 55
(4)
◽
pp. 279-283
◽