Fourier analysis of leed intensities in the determination of surface structures

1972 ◽  
Vol 30 (3) ◽  
pp. 553-560 ◽  
Author(s):  
T.A. Clarke ◽  
R. Mason ◽  
M. Tescari
Keyword(s):  
Fourier Analysis ◽  
Surface Structures

Ultrathin Platinum Crystal Surface Structures

1985 ◽  
Vol 43 ◽  
pp. 394-395
Author(s):  
R. L. Hines
Keyword(s):  
Crystal Surface ◽  
Surface Structures ◽  
Platinum Surface ◽  
Platinum Surfaces ◽  
Resolution Level ◽  
Experimental Facilities ◽  
Carbon Backing ◽  
Mesh Grid ◽  
Atom Layer

The importance of atom layer terraces or steps on platinum surfaces used for catalysis as discussed by Somorjai justifies an extensive investigation of the structure of platinum surfaces through electron microscopy at the atomic resolution level. Experimental and theoretical difficulties complicate the quantitative determination of platinum surface structures but qualitative observation of surface structures on platinum crystals is now possible with good experimental facilities.Ultrathin platinum crystals with nominal 111 orientation are prepared using the procedure reported by Hines without the application of a carbon backing layer. Platinum films with thicknesses of about ten atom layers are strong enough so that they can be mounted on grids to provide ultrathin platinum crystals for examination of surface structure. Crystals as thin as possible are desired to minimize the theoretical difficulties in analyzing image contrast to determine structure. With the current preparation procedures the crystals frequently cover complete openings on a 400 mesh grid.

Fourier analysis determination of best focus in submicron lithography

1994 ◽  
Author(s):  
S. Jeffrey Rosner ◽  
Nader Shamma ◽  
Frederik Sporon-Fiedler
Keyword(s):  
Fourier Analysis ◽  
Analysis Determination

scholarly journals Fourier Analysis of AC Polarography. Elimination of Non-Faradaic Effects and Determination of Kinetic Parameters for Cd(II)-Na2SO4System

1974 ◽  
Vol 47 (10) ◽  
pp. 2486-2489 ◽  
Author(s):  
Michio Hirota ◽  
Yoshio Umezawa ◽  
Hiroyuki Kojima ◽  
Shizuo Fujiwara
Keyword(s):  
Fourier Analysis ◽  
Kinetic Parameters

Fitting dozens of coordinates by LEED: automated determination of complex surface structures

1993 ◽  
Vol 287-288 ◽  
pp. 428-431 ◽  
Author(s):  
M.A. Van Hove ◽  
W. Moritz ◽  
H. Over ◽  
P.J. Rous ◽  
A. Wander ◽  
...  
Keyword(s):  
Complex Surface ◽  
Surface Structures ◽  
Automated Determination

Analysis of surface structures through determination of their composition using STM: Si(100)4×3-In and Si(111)4×1-In reconstructions

1999 ◽  
Vol 60 (20) ◽  
pp. 14372-14381 ◽  
Author(s):  
A. A. Saranin ◽  
A. V. Zotov ◽  
V. G. Lifshits ◽  
J. -T. Ryu ◽  
O. Kubo ◽  
...  
Keyword(s):  
Surface Structures

DETERMINATION OF COMPLEX SURFACE STRUCTURES WITH LEED

1997 ◽  
Vol 04 (03) ◽  
pp. 479-487 ◽  
Author(s):  
M. A. VAN HOVE
Keyword(s):  
Complex Surface ◽  
Surface Structures ◽  
Considerable Progress ◽  
Structural Determination ◽  
Experimental Dataset ◽  
The One ◽  
Correct Structure

The evolution of the complexity of structural determination attainable with LEED is reviewed. Considerable progress in methodologies and computers has enabled structures as complex as Cu(100) + (4 × 4)- 10Li to be solved in terms of 18 fit parameters. The Si(111)-(7 × 7) structure could now be refined in terms of 100-or-so fit parameters, if a large-enough experimental dataset were available. Big challenges remain: finding a direct or quick way to identify the one qualitatively correct structure; and, to a lesser degree, providing the required size of the experimental dataset.

Structure determination of amorphous PbTiO3by Fourier analysis of exafs

1981 ◽  
Vol 37 (1) ◽  
pp. 599-602 ◽  
Author(s):  
H. Terauchi ◽  
H. Maeda ◽  
K. Tanabe ◽  
N. Kamijo ◽  
M. Hida ◽  
...  
Keyword(s):  
Fourier Analysis ◽  
Structure Determination
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