A resistive measurement of Tc in indium films far from continuity

1982 ◽  
Vol 90 (2) ◽  
pp. 229
Author(s):  
M.L. Rappaport ◽  
G. Deutscher
2020 ◽  
Vol 55 (11) ◽  
pp. 3036-3050 ◽  
Author(s):  
Meraj Ahmad ◽  
Shahid Malik ◽  
Sourya Dewan ◽  
Arnesh K. Bose ◽  
Dinesh Maddipatla ◽  
...  

1994 ◽  
Vol 75 (12) ◽  
pp. 8163-8167 ◽  
Author(s):  
D. H. Kim ◽  
K. E. Gray ◽  
J. D. Hettinger ◽  
J. H. Kang ◽  
S. S. Choi

1997 ◽  
Vol 30 (4) ◽  
pp. 399-402 ◽  
Author(s):  
A.D.J. Pinder ◽  
D.W. Grieve

Photonics ◽  
2021 ◽  
Vol 8 (4) ◽  
pp. 120
Author(s):  
Ricardo Gonzalez-Romero ◽  
Marija Strojnik ◽  
Guillermo Garcia-Torales ◽  
Gilberto Gomez-Rosas

A shock wave is a mechanical high-pressure pulse that travels inside a medium with a full width at half-maximum of a few nanoseconds that may be induced with a high-power laser pulse. A piezo-resistive measurement method to determine the shock wave pressure has been widely employed even though there is inner inaccuracy in the calibration process. We are interested in developing a precise theoretical model of laser material processing for applications in material sciences that includes the frequency dependence of the electronic post processing. We show an approach to determine the correction factor to frequency response at a high frequency of a piezo-resistive experimental setup and the results of the pressure measurements obtained in this experimental setup. The theoretical and experimental work demonstrates the feasibility of piezo-resistive methods to measure a laser-induced shock wave pressure in the nanosecond range. The correction factor of the frequency dependence calibration allows the technique to be applied in different shock wave experiments.


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