A mapping finite element method for the analysis of laterally loaded single piles

1989 ◽  
Vol 7 (3) ◽  
pp. 255-266 ◽  
Author(s):  
B. Nath
2013 ◽  
Vol 834-836 ◽  
pp. 1612-1615
Author(s):  
Ruo Yin Zhang ◽  
Feng Zhu ◽  
Zong Ze Lu ◽  
Yue Zhang

At present, it is scarcely possible to represent results in deterministic calculation in the definite finite element analysis. Stochastic finite element method is on the basis of the combination of mathematical statistics and the finite element method. Then we can use mathematical statistics to analyze the randomness of the parameters, get the data of dependent displacement and stress, and finally calculate all kinds of features. In this paper, modeling and calculation function and unique PDS module offered by ANSYS are applied to analyze the reliability of lateral load bearing single-piles.


Nanoscale ◽  
2019 ◽  
Vol 11 (43) ◽  
pp. 20868-20875 ◽  
Author(s):  
Junxiong Guo ◽  
Yu Liu ◽  
Yuan Lin ◽  
Yu Tian ◽  
Jinxing Zhang ◽  
...  

We propose a graphene plasmonic infrared photodetector tuned by ferroelectric domains and investigate the interfacial effect using the finite element method.


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