Adaptive fourier-filtering technique for quantitative evaluation of high-resolution electron micrographs of interfaces

1993 ◽  
Vol 49 (1-4) ◽  
pp. 46-65 ◽  
Author(s):  
G. Möbus ◽  
G. Necker ◽  
M. Rühle
Keyword(s):  
High Resolution ◽  
Quantitative Evaluation ◽  
Electron Micrographs ◽  
Resolution Electron ◽  
Fourier Filtering ◽  
Filtering Technique ◽  
High Resolution Electron Micrographs
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