Cross-correlation method for intensity measurement of transmission electron diffraction patterns

1994 ◽  
Vol 53 (1) ◽  
pp. 15-18 ◽  
Author(s):  
P. Xu ◽  
G. Jayaram ◽  
L.D. Marks
Author(s):  
Prakash Rao ◽  
R. P. Goehner

The process of indexing electron diffraction patterns is well established and reasonably straightforward. However, in the more complicated crystal systems (e.g. hexagonal, rhombohedral, orthorhombic and monoclinic), indexing and orientation determination is not always simple. In order to considerably ease the tedium of routinely indexing such electron diffraction patterns, automation of the procedure has been carried out in our laboratory by the use of two computer programs written in conversational Fortran.Simplified flow diagrams of the two programs are shown in Figure 1. The first program (Figure 1a) indexes diffraction spots whose x and y coordinates are obtained from an experimental pattern and supplied, along with crystal structure, lattice constants, space group restrictions, camera constant, and the position and angle errors allowable.


Author(s):  
R. H. Geiss

A technique of selective micro-area transmission electron diffraction has been developed using the Philips 301 TEM with a scanning (STEM) attachment. With this technique we are able to obtain electron diffraction patterns from selected areas less than 30 Å in diameter or about 103 atoms! This is to be compared with the best published results which show selected area diffraction (SAD) from areas at least 100 Å in diameter, approximately 105 atoms, or the conventional SAD techniques applicable to areas down to 2000 Å diameter, approximately 5 x 106 atoms. (The number of atoms was calculated assuming a 50 Å thick film of a f.c.c. structure with ao = 5 Å.) The selected micro-area capability was proven by experimentally obtaining discrete single crystal diffraction patterns from an array of evaporated gold particles some less than 30 Å diameter and separated by 30 Å or less, Fig. 1.


1998 ◽  
Vol 6 (9) ◽  
pp. 16-17
Author(s):  
Corneliu Sårbu

It is well known to electron microscopists working in the field of materials structure research that the importance of transmission electron diffraction patterns (TED) is: (i) establishing the crystallographic orientation correlations revealed during the practical observation of multiphase specimens and (ii) the knowledge of exact crystallographic orientation of a single crystal area in the specimen relating to image contrast interpretation.


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