Monte Carlo calculations of escape fractions in the determination of fricke G-values for monochromatic soft X-rays

1991 ◽  
Vol 38 (1) ◽  
pp. 11-15 ◽  
Author(s):  
S. Uehara ◽  
M. Hoshi ◽  
O. Yamamoto ◽  
S. Sawada ◽  
K. Kobayashi ◽  
...  
Keyword(s):  
Monte Carlo ◽  
X Rays ◽  
Monte Carlo Calculations

Monte Carlo Calculations of Free Ammonia Production in Deoxygenated Solutions of Glycylglycine Irradiated by X Rays and 60 Co g Rays

1990 ◽  
Vol 121 (3) ◽  
pp. 248 ◽  
Author(s):  
Wesley E. Bolch ◽  
J. E. Turner ◽  
H. Yoshida ◽  
K. Bruce Jacobson ◽  
H. A. Wright ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Free Ammonia ◽  
X Rays ◽  
Ammonia Production ◽  
Monte Carlo Calculations

Monte carlo determination of long-range pair interaction energies from diffuse scattering of X-rays by alloys

1983 ◽  
Vol 119 (1) ◽  
pp. 147-151 ◽  
Author(s):  
Yu. S. Stark ◽  
A. S. Steinberg ◽  
V. M. Vasilev ◽  
V. I. Dimitrov
Keyword(s):  
Monte Carlo ◽  
Long Range ◽  
Diffuse Scattering ◽  
Pair Interaction ◽  
X Rays ◽  
Interaction Energies

Experimental determination of the total enhancement factor in x-ray microanalysis of thin overlayers

1990 ◽  
Vol 48 (2) ◽  
pp. 218-219
Author(s):  
A. G. Nassiopoulos ◽  
E. Valamontes ◽  
T. Travlos ◽  
C. Tsamis
Keyword(s):  
Enhancement Factor ◽  
Bulk Material ◽  
Primary Beam ◽  
X Rays ◽  
Correction Factors ◽  
X Ray ◽  
Backscattered Electrons ◽  
Monte Carlo Calculations ◽  
Cu Film

The total enhancement factor in X-ray Microanalysis of thin overlayers has been measured at different primary beam energies by comparing the signal from a thin film deposited on a bulk material to that from a thin unsupported film of the same composition. This enhancement factor contains the contribution of both backscattered electrons and characteristic and bremsstrahlung X-rays created in the bulk by the primary beam , which ionize the film in their way out of the sample.The experimental results from a Cu film on different substrates ( Si, Ni and Au ) are compared to Monte-Carlo calculations, performed by the authors. In these calculations [1,2] all three correction factors cited above (backscattering, characteristic and continuous X-rays from the bulk) are taken into account. It is thus demonstated that the contribution of continuous X-rays from the bulk take important values (as high as 12-14%) in cases where the substrate is of a high Z material at high primary beam energies (40 keV).

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