THE DETERMINATION OF COMPLEX REFRACTIVE INDEX SPECTRA OF LIQUIDS IN THE FAR-INFRARED SPECTRAL REGION 5–500 cm-1, WITH DISPERSIVE FOURIER TRANSFORM SPECTROMETRY

1976 ◽  
pp. 257-262
Author(s):  
D.D. HONIJK ◽  
W.F. PASSCHIER ◽  
M. MANDEL ◽  
M.N. AFSAR
Keyword(s):  
Refractive Index ◽  
Fourier Transform ◽  
Spectral Region ◽  
Complex Refractive Index ◽  
Far Infrared ◽  
Infrared Spectral Region ◽  
Fourier Transform Spectrometry ◽  
Infrared Spectral

Composés de coordination de molécules soufrées. II. Complexes pseudo-tétraédriques et plan du nickel(II) avec quelques dithiole-1,2 thiones-3

1971 ◽  
Vol 49 (15) ◽  
pp. 2598-2604 ◽  
Author(s):  
François Yves Petillon ◽  
Jacques Emile Guerchais
Keyword(s):  
Solid State ◽  
Electronic Spectra ◽  
Spectral Region ◽  
Far Infrared ◽  
Infrared Spectral Region ◽  
Planar Complex ◽  
Square Planar ◽  
Infrared Spectral ◽  
Tetrahedral Complexes

The study of the far infrared spectral region permits one to distinguish between the pseudo-tetrahedral complexes NiI2L2 (L = R1R2C3S3 where R1 = CH3 and R2 = H, R1 = R2 = CH3, R1 = C4H3S and R2 = H) and the square planar complex NiI2L′2 (L′ = R1R2C3S3 where R1 = C6H5 and R2 = H). The electronic spectra recorded in the solid state confirm the distinction. The displacement of the band νC=S of the molecule 1,2-dithio-1-3-thione which enters the sphere of coordination is more marked in the complexes of cobalt(II) than in the corresponding nickel(II) complexes.

Determination of thin film refractive index and thickness by means of film phase thickness

Open Physics ◽  
2008 ◽  
Vol 6 (2) ◽  
Author(s):  
Milen Nenkov ◽  
Tamara Pencheva
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Refractive Index ◽  
Barium Titanate ◽  
Spectral Region ◽  
Complex Refractive Index ◽  
Refractive Index Dispersion ◽  
New Approach ◽  
Phase Thickness

AbstractA new approach for determination of refractive index dispersion n(λ) (the real part of the complex refractive index) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate thin films are investigated in the spectral region 0.38–0.78 μm and their n(λ) and d are calculated. The approach is validated using Swanepoel’s method and it is found to be applicable for relatively thin films when measured transmittance spectra have one minimum and one maximum only.

scholarly journals All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region

2000 ◽  
Vol 77 (7) ◽  
pp. 930 ◽  
Author(s):  
E. B. Franke ◽  
C. L. Trimble ◽  
M. Schubert ◽  
J. A. Woollam ◽  
J. S. Hale
Keyword(s):  
Solid State ◽  
Spectral Region ◽  
Far Infrared ◽  
Infrared Spectral Region ◽  
Infrared Spectral
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