Accelerated Life Test, Reliability Growth Analysis, and Probabilistic Degradation Analysis

2016 ◽  
pp. 93-158 ◽  
Author(s):  
Eduardo Calixto
Keyword(s):  
Growth Analysis ◽  
Accelerated Life Test ◽  
Test Reliability ◽  
Reliability Growth ◽  
Life Test ◽  
Accelerated Life ◽  
Degradation Analysis

The Statistics Analysis of Degradation Data Based on the Degradation Amount Distribution

2013 ◽  
Vol 791-793 ◽  
pp. 1260-1263
Author(s):  
Yi Zhou He ◽  
Jin Huang Wu ◽  
Yi Dong Wang ◽  
Wei Hua Liu
Keyword(s):  
High Reliability ◽  
Performance Degradation ◽  
Accelerated Life Test ◽  
Test Reliability ◽  
Analysis Method ◽  
Life Test ◽  
Failure Data ◽  
Degradation Data ◽  
Accelerated Life ◽  
Long Life

In order to solve the key technology and method in reliability study of the long-life products, the analysis method of degradation data based on the degradation amount distribution was proposed in this paper. On the basis of statistical model, by analyzing three models of degradation amount distribution, it can be got there is a large number of reliability information with high-reliable and long-life products in performance degradation data. In the case of not getting the failure data by life test and accelerated life test, reliability assessment and life prediction could be carried out for high reliability and long life products with performance degradation data.

The Statistics Analysis of Degradation Data Based on the Degradation Amount Distribution

2013 ◽  
Vol 739 ◽  
pp. 781-784
Author(s):  
Jun Sheng Wang ◽  
Yi Zhou He ◽  
Jin Huang Wu ◽  
Jun Wei Lei
Keyword(s):  
High Reliability ◽  
Performance Degradation ◽  
Accelerated Life Test ◽  
Test Reliability ◽  
Analysis Method ◽  
Life Test ◽  
Failure Data ◽  
Degradation Data ◽  
Accelerated Life ◽  
Long Life

In order to solve the key technology and method in reliability study of the long-life products, the analysis method of degradation data based on the degradation amount distribution was proposed in this paper. On the basis of statistical model, by analyzing three models of degradation amount distribution, it can be got there is a large number of reliability information with high-reliable and long-life products in performance degradation data. In the case of not getting the failure data by life test and accelerated life test, reliability assessment and life prediction could be carried out for high reliability and long life products with performance degradation data.

Study of High-Power White LED's Lifetime Based on Accelerated Life Test

2013 ◽  
Vol 800 ◽  
pp. 205-209 ◽  
Author(s):  
De Sheng Li ◽  
Nian Yu Zou ◽  
Yun Cui Zhang ◽  
Xiao Yang He ◽  
Yi Yang
Keyword(s):  
High Power ◽  
Accelerated Life Test ◽  
Reliability Test ◽  
White Led ◽  
Life Test ◽  
Arrhenius Model ◽  
White Leds ◽  
Accelerated Life ◽  
Temperature Levels

The study of LED reliability becomes more and more important with LED widely used in various areas, and accelerated life test (ALT) as an element of reliability test is widely used to predict the lifetime of LED. In this paper, ALTs have been carried out at various current levels and various temperature levels. In the current ALT experiment, three kinds of stressing currents were demonstrated for 1W white LEDs and lumen flux of the tested LEDs were studied, and based on Eyting model, lifetime of the tested LEDs is calculated about 6.86×105h. In the temperature ALT experiment, two kinds of stressing temperature were demonstrated for the same type of white LEDs and lumen flux were also studied, and based on Arrhenius model, lifetime of the tested LEDs is calculated about 7.41×105h. In addition, the color shifting velocity is faster than lumens depreciation velocity was observed in our experiment, which means the lifetime evaluating of white LED should be paid more attention.

Sign in / Sign up

Export Citation Format

Share Document