New goals for acoustic emission in materials research

2000 ◽  
pp. 57-76 ◽  
Author(s):  
Kanji Ono
Keyword(s):  
Acoustic Emission ◽  
Materials Research

scholarly journals ACOUSTIC EMISSION TECHNIQUES IN MATERIALS RESEARCH.

1970 ◽  
Author(s):  
R.G. Liptai ◽  
D.O. Harris ◽  
R.B. Engle ◽  
C.A. Tatro
Keyword(s):  
Acoustic Emission ◽  
Materials Research

High-voltage Electron Microscopy: Where it is and where it may be going

1995 ◽  
Vol 53 ◽  
pp. 80-81
Author(s):  
Charles W. Allen
Keyword(s):  
Electron Microscopy ◽  
High Voltage ◽  
Construction Cost ◽  
Research Community ◽  
High Voltage Electron Microscopy ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
Materials Research

High voltage TEMs were introduced commercially thirty years ago, with the installations of 500 kV Hitachi instruments at the Universities of Nogoya and Tokyo. Since that time a total of 51 commercial instruments, having maximum accelerating potentials of 0.5-3.5 MV, have been delivered. Prices have gone from about a dollar per volt for the early instruments to roughly twenty dollars per volt today, which is not so unreasonable considerinp inflation and vastly improved electronics and other improvements. The most expensive HVEM (the 3.5 MV instrument at Osaka University) cost about 5 percent of the construction cost of the USA's latest synchrotron.Table 1 briefly traces the development of HVEM in this country for the materials sciences. There are now only three available instruments at two sites: the 1.2 MeV HVEM at Argonne National Lab, and 1.0 and 1.5 MeV instruments at Lawrence Berkeley National Lab. Fortunately, both sites are user facilities funded by DOE for the materials research community.

Propagation of acoustic emission signals in metallic fuselage structure

2001 ◽  
Vol 148 (4) ◽  
pp. 169-177 ◽  
Author(s):  
R.P. Dalton ◽  
P. Cawley ◽  
M.J. Lowe
Keyword(s):  
Acoustic Emission

Comparison of random field strengths in (1-x)SrTiO3-xBiFeO3 and (1-x)SrTiO3-xBaTiO3 relaxor ferroelectrics by means of acoustic emission

2020 ◽  
Vol 92 (2) ◽  
pp. 20401
Author(s):  
Evgeniy Dul'kin ◽  
Michael Roth
Keyword(s):  
Acoustic Emission ◽  
Random Field ◽  
Electric Fields ◽  
Bias Field ◽  
Relaxor Ferroelectrics ◽  
External Bias ◽  
Field Strengths

In relaxor (1-x)SrTiO3-xBiFeO3 ferroelectrics ceramics (x = 0.2, 0.3 and 0.4) both intermediate temperatures and Burns temperatures were successfully detected and their behavior were investigated in dependence on an external bias field using an acoustic emission. All these temperatures exhibit a non-trivial behavior, i.e. attain the minima at some threshold fields as a bias field enhances. It is established that the threshold fields decrease as x increases in (1-x)SrTiO3-xBiFeO3, as it previously observed in (1-x)SrTiO3-xBaTiO3 (E. Dul'kin, J. Zhai, M. Roth, Phys. Status Solidi B 252, 2079 (2015)). Based on the data of the threshold fields the mechanisms of arising of random electric fields are discussed and their strengths are compared in both these relaxor ferroelectrics.

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