Structure and characterization of the dislocations in tilt grain boundaries between Σ = 1 and Σ = 3: a high resolution electron microscopy study

1993 ◽  
pp. 93-100 ◽  
Author(s):  
J. Thibault ◽  
J.L. Putaux ◽  
A. Jacques ◽  
A. George ◽  
H.M. Michaud ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Grain Boundaries ◽  
High Resolution Electron Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Resolution Electron

High resolution electron microscopy study of the cationic disorder in Al2TiO5

1991 ◽  
Vol 6 (1) ◽  
pp. 138-145 ◽  
Author(s):  
T. Epicier ◽  
G. Thomas ◽  
H. Wohlfromm ◽  
J.S. Moya
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Microstructural Characterization ◽  
High Resolution Electron Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Experimental Conditions ◽  
Resolution Electron ◽  
Point To Point

As part of a research program devoted to the microstructural characterization of Al2TiO5-based compounds, high resolution electron microscopy (HREM) has been undertaken in order to study the crystallographic arrangement, especially ordering possibilities, of Al and Ti cations in the metallic sublattice of aluminum titanate. It is seen that adequate experimental conditions, mainly defocus setting, for a resolution of at least 2.5 Å point-to-point, enable the disordered model to be directly and unambiguously proved on 100-oriented micrographs.

High-resolution electron microscopy of nanostructured materials

1995 ◽  
Vol 53 ◽  
pp. 172-173
Author(s):  
M. José-Yacamán
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Grain Boundaries ◽  
Nanostructured Materials ◽  
High Resolution Electron Microscopy ◽  
Hrem Image ◽  
Small Particles ◽  
Resolution Electron ◽  
Nanophase Materials

Electron microscopy is a fundamental tool in materials characterization. In the case of nanostructured materials we are looking for features with a size in the nanometer range. Therefore often the conventional TEM techniques are not enough for characterization of nanophases. High Resolution Electron Microscopy (HREM), is a key technique in order to characterize those materials with a resolution of ~ 1.7A. High resolution studies of metallic nanostructured materials has been also reported in the literature. It is concluded that boundaries in nanophase materials are similar in structure to the regular grain boundaries. That work therefore did not confirm the early hipothesis on the field that grain boundaries in nanostructured materials have a special behavior. We will show in this paper that by a combination of HREM image processing, and image calculations, it is possible to prove that small particles and coalesced grains have a significant surface roughness, as well as large internal strain.

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