Mapping molecular adhesion sites inside SMIL coated capillaries using atomic force microscopy recognition imaging

2016 ◽  
Vol 930 ◽  
pp. 39-48 ◽  
Author(s):  
Michael Leitner ◽  
Lorenz G. Stock ◽  
Lukas Traxler ◽  
Laurent Leclercq ◽  
Klaus Bonazza ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Molecular Adhesion ◽  
Adhesion Sites ◽  
Atomic Force ◽  
Recognition Imaging ◽  
Coated Capillaries

Atomic Force Microscopy (AFM) for Topography and Recognition Imaging at Single Molecule Level

2013 ◽  
pp. 102-112
Author(s):  
Memed Duman ◽  
Andreas Ebner ◽  
Christian Rankl ◽  
Jilin Tang ◽  
Lilia A. Chtcheglova ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Single Molecule Level ◽  
Force Microscopy ◽  
Atomic Force ◽  
Recognition Imaging

Recognition Imaging Using Atomic Force Microscopy

2009 ◽  
pp. 525-554 ◽  
Author(s):  
Andreas Ebner ◽  
Lilia Chtcheglova ◽  
Jilin Tang ◽  
David Alsteens ◽  
Vincent Dupres ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Recognition Imaging

Atomic Force Microscopy (AFM) for Topography and Recognition Imaging at Single-Molecule Level

2018 ◽  
pp. 1-14
Author(s):  
Memed Duman ◽  
Yoo Jin Oh ◽  
Rong Zhu ◽  
Michael Leitner ◽  
Andreas Ebner ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Single Molecule Level ◽  
Force Microscopy ◽  
Atomic Force ◽  
Recognition Imaging

scholarly journals Single-molecule anatomy by atomic force microscopy and recognition imaging

2009 ◽  
Vol 72 (4/5) ◽  
pp. 217-225 ◽  
Author(s):  
Hirohide Takahashi ◽  
Kohji Hizume ◽  
Masahiro Kumeta ◽  
Shige H. Yoshimura ◽  
Kunio Takeyasu
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Force Microscopy ◽  
Atomic Force ◽  
Recognition Imaging

scholarly journals Polyacrylamide-Coated Capillaries Probed by Atomic Force Microscopy:  Correlation between Surface Topography and Electrophoretic Performance

1998 ◽  
Vol 70 (16) ◽  
pp. 3458-3462 ◽  
Author(s):  
Alejandro Cifuentes ◽  
Jose C. Díez-Masa ◽  
Jürgen Fritz ◽  
Dario Anselmetti ◽  
Alfredo E. Bruno
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Topography ◽  
Force Microscopy ◽  
Atomic Force ◽  
Coated Capillaries

(Multi)functional Atomic Force Microscopy Imaging

2018 ◽  
Vol 11 (1) ◽  
pp. 329-350 ◽  
Author(s):  
Anisha N. Patel ◽  
Christine Kranz
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Information ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Research Areas ◽  
Atomic Force ◽  
Electrochemical Imaging ◽  
Recognition Imaging ◽  
Specific Reactions ◽  
Physical And Chemical

Incorporating functionality to atomic force microscopy (AFM) to obtain physical and chemical information has always been a strong focus in AFM research. Modifying AFM probes with specific molecules permits accessibility of chemical information via specific reactions and interactions. Fundamental understanding of molecular processes at the solid/liquid interface with high spatial resolution is essential to many emerging research areas. Nanoscale electrochemical imaging has emerged as a complementary technique to advanced AFM techniques, providing information on electrochemical interfacial processes. While this review presents a brief introduction to advanced AFM imaging modes, such as multiparametric AFM and topography recognition imaging, the main focus herein is on electrochemical imaging via hybrid AFM-scanning electrochemical microscopy. Recent applications and the challenges associated with such nanoelectrochemical imaging strategies are presented.

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