A versatile technique for radiochemical separation of medically useful no-carrier-added (nca) radioarsenic from irradiated germanium oxide targets

2007 ◽  
Vol 65 (11) ◽  
pp. 1202-1207 ◽  
Author(s):  
Sankha Chattopadhyay ◽  
Sujit Pal ◽  
K.V. Vimalnath ◽  
M.K. Das
2002 ◽  
Vol 90 (6) ◽  
Author(s):  
P. R. Unni ◽  
M.R.A. Pillai

SummaryProduction of no carrier added


2000 ◽  
Vol 53 (3) ◽  
pp. 421-425 ◽  
Author(s):  
Nikolai A. Lebedev ◽  
Alexander F. Novgorodov ◽  
Riscard Misiak ◽  
Jörg Brockmann ◽  
Frank Rösch

2005 ◽  
Vol 263 (1) ◽  
pp. 23-28 ◽  
Author(s):  
M. L. Bonardi ◽  
E. Rizzio ◽  
M. Gallorini ◽  
F. Groppi ◽  
H. S. Mainardi

2005 ◽  
Vol 63 (3) ◽  
pp. 343-351 ◽  
Author(s):  
M. Jennewein ◽  
S.M. Qaim ◽  
A. Hermanne ◽  
M. Jahn ◽  
E. Tsyganov ◽  
...  

2020 ◽  
Vol 325 (3) ◽  
pp. 875-883
Author(s):  
Ramu Ram ◽  
Rubel Chakravarty ◽  
Sachin Jadhav ◽  
Sudipta Chakraborty ◽  
K. C. Jagadeesan ◽  
...  

Nanomaterials ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 1494
Author(s):  
Mustapha El Hariri El Nokab ◽  
Khaled O. Sebakhy

Solid-state NMR has proven to be a versatile technique for studying the chemical structure, 3D structure and dynamics of all sorts of chemical compounds. In nanotechnology and particularly in thin films, the study of chemical modification, molecular packing, end chain motion, distance determination and solvent-matrix interactions is essential for controlling the final product properties and applications. Despite its atomic-level research capabilities and recent technical advancements, solid-state NMR is still lacking behind other spectroscopic techniques in the field of thin films due to the underestimation of NMR capabilities, availability, great variety of nuclei and pulse sequences, lack of sensitivity for quadrupole nuclei and time-consuming experiments. This article will comprehensively and critically review the work done by solid-state NMR on different types of thin films and the most advanced NMR strategies, which are beyond conventional, and the hardware design used to overcome the technical issues in thin-film research.


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