The concentration profiles of thin-film Pt/bulk Ni coatings annealed at 1150,
1250 and 1300?C for different time were measured by means of electron probe
microanalysis. The corresponding interdiffusion coefficients were then
determined using the thin-film solution. The calculated concentration
profiles based on the presently obtained interdiffusion coefficients agree
well with the experimental ones, but better at a higher temperature or a
longer time. The comparison between the presently measured concentration
profiles and the DICTRA simulated ones indicates that it is promising to
apply the well-established atomic mobility databases due to bulk diffusion
information in coating systems with some simple modifications for
diffusivities.