The three books reviewed in this column are about central ideas in algorithms, complexity, and geometry. The third one brings together topics from the first two by applying techniques of both property testing (the subject of the first book) and parameterized complexity (including its more focused incarnation studied in the second book, kernelization) to geometric problems.
In this paper, Experimental results on the measurement of mechanical properties of fine patterns in the MEMS structure are described. The mechanical properties of embossing patterns on metallic thin foil is measured using the nano indentation system, that is developed by Korea Institute of Industrial Technology(KITECH). These micro embossing patterns are fabricated using CIP(Cold Isostatic Press) process on micro metallic thin foils(Al-1100) that are made by rolling process. These embossing patterned metallic thin foils(Al-1100) are used in the reflecting plate of BLU(Back Light Unit) and electrical/mechanical MEMS components. If these mechanical properties of fine patterns are utilized in a design procedure, the optimal design can be achieved in aspects of reliability as well as economy.
Quantum gate verification and its application in property testing
