Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

2006 ◽  
Vol 15 (4-8) ◽  
pp. 618-621 ◽  
Author(s):  
F. Houzé ◽  
J. Alvarez ◽  
J.-P. Kleider ◽  
P. Bergonzo ◽  
E. Snidero ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Schottky Diodes ◽  
Electrical Characterization ◽  
Diamond Surfaces ◽  
Force Microscopy ◽  
Atomic Force

Conducting atomic force microscopy for nanoscale electrical characterization of thin SiO2

1998 ◽  
Vol 73 (21) ◽  
pp. 3114-3116 ◽  
Author(s):  
Alexander Olbrich ◽  
Bernd Ebersberger ◽  
Christian Boit
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Force Microscopy ◽  
Atomic Force

Electrical Characterization of Bismuth Sulfide Nanowire Arrays by Conductive Atomic Force Microscopy

2008 ◽  
Vol 112 (49) ◽  
pp. 19680-19685 ◽  
Author(s):  
Pavels Birjukovs ◽  
Nikolay Petkov ◽  
Ju Xu ◽  
Janis Svirksts ◽  
John J. Boland ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Nanowire Arrays ◽  
Bismuth Sulfide ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy

2001 ◽  
Vol 78 (26) ◽  
pp. 4181-4183 ◽  
Author(s):  
M. Porti ◽  
M. Nafrı́a ◽  
X. Aymerich ◽  
A. Olbrich ◽  
B. Ebersberger
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Nanometer Scale ◽  
Sio2 Films ◽  
Force Microscopy ◽  
Atomic Force
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