Electrical characterization of HgTe nanowires using conductive atomic force microscopy
2010 ◽
Vol 30
(7)
◽
pp. 1761-1764
◽
Electrical Characterization of Bismuth Sulfide Nanowire Arrays by Conductive Atomic Force Microscopy
2008 ◽
Vol 112
(49)
◽
pp. 19680-19685
◽
2006 ◽
Vol 243
(1)
◽
pp. 16-19
◽
2015 ◽
Vol 70
◽
pp. 373-378
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2002 ◽
Vol 389-393
◽
pp. 667-670
◽
2010 ◽
Vol 25
(2)
◽
pp. 213-218
◽