Electrical characterization of Schottky diodes based on boron doped homoepitaxial diamond films by conducting probe atomic force microscopy

2006 ◽  
Vol 40 (4-6) ◽  
pp. 343-349 ◽  
Author(s):  
J. Alvarez ◽  
F. Houzé ◽  
J.P. Kleider ◽  
M.Y. Liao ◽  
Y. Koide
Keyword(s):  
Atomic Force Microscopy ◽  
Schottky Diodes ◽  
Diamond Films ◽  
Electrical Characterization ◽  
Force Microscopy ◽  
Atomic Force ◽  
Boron Doped

Conducting atomic force microscopy for nanoscale electrical characterization of thin SiO2

1998 ◽  
Vol 73 (21) ◽  
pp. 3114-3116 ◽  
Author(s):  
Alexander Olbrich ◽  
Bernd Ebersberger ◽  
Christian Boit
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Force Microscopy ◽  
Atomic Force

Electrical Characterization of Bismuth Sulfide Nanowire Arrays by Conductive Atomic Force Microscopy

2008 ◽  
Vol 112 (49) ◽  
pp. 19680-19685 ◽  
Author(s):  
Pavels Birjukovs ◽  
Nikolay Petkov ◽  
Ju Xu ◽  
Janis Svirksts ◽  
John J. Boland ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Nanowire Arrays ◽  
Bismuth Sulfide ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy

2001 ◽  
Vol 78 (26) ◽  
pp. 4181-4183 ◽  
Author(s):  
M. Porti ◽  
M. Nafrı́a ◽  
X. Aymerich ◽  
A. Olbrich ◽  
B. Ebersberger
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Nanometer Scale ◽  
Sio2 Films ◽  
Force Microscopy ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document