Degradation data analysis based on gamma process with random effects

Author(s):  
Xiaofei Wang ◽  
Bing Xing Wang ◽  
Yili Hong ◽  
Pei Hua Jiang
2015 ◽  
Vol 2015 ◽  
pp. 1-8 ◽  
Author(s):  
Huibing Hao ◽  
Chun Su ◽  
Chunping Li

Light emitting diode (LED) lamp has attracted increasing interest in the field of lighting systems due to its low energy and long lifetime. For different functions (i.e., illumination and color), it may have two or more performance characteristics. When the multiple performance characteristics are dependent, it creates a challenging problem to accurately analyze the system reliability. In this paper, we assume that the system has two performance characteristics, and each performance characteristic is governed by a random effects Gamma process where the random effects can capture the unit to unit differences. The dependency of performance characteristics is described by a Frank copula function. Via the copula function, the reliability assessment model is proposed. Considering the model is so complicated and analytically intractable, the Markov chain Monte Carlo (MCMC) method is used to estimate the unknown parameters. A numerical example about actual LED lamps data is given to demonstrate the usefulness and validity of the proposed model and method.


IEEE Access ◽  
2019 ◽  
Vol 7 ◽  
pp. 37896-37907 ◽  
Author(s):  
Donghui Pan ◽  
Siliang Lu ◽  
Yongbin Liu ◽  
Wenzhi Yang ◽  
Jia-Bao Liu

Author(s):  
Luis Alberto Rodríguez-Picón ◽  
Anna Patricia Rodríguez-Picón ◽  
Luis Carlos Méndez-González ◽  
Manuel I. Rodríguez-Borbón ◽  
Alejandro Alvarado-Iniesta

2020 ◽  
Vol 77 ◽  
pp. 1413-1424
Author(s):  
Ancha Xu ◽  
You-Gan Wang ◽  
Shurong Zheng ◽  
Fengjing Cai

2012 ◽  
Vol 39 (12) ◽  
pp. 2721-2739 ◽  
Author(s):  
Julio C. Ferreira ◽  
Marta A. Freitas ◽  
Enrico A. Colosimo

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