Segmentation of Scanning-Transmission Electron Microscopy Images using the Ordered Median Problem

Median Problem ◽

Ordered Median ◽

Transmission Electron ◽

Scanning Transmission ◽

How precise can atoms of a nanocluster be positioned in 3D from a tilt series of scanning transmission electron microscopy images?

European Microscopy Congress 2016: Proceedings ◽

10.1002/9783527808465.emc2016.6005 ◽

2016 ◽

pp. 75-76

Author(s):

Marcos Alania ◽

Annick De Backer ◽

Ivan Lobato ◽

Florian F. Krause ◽

Dirk Van Dyck ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron ◽

Scanning Transmission ◽

Tilt Series ◽

Identification of Time Series Models From Segments—Application to Scanning Transmission Electron Microscopy Images

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2013.2272198 ◽

2013 ◽

Vol 62 (12) ◽

pp. 3231-3242 ◽

Cited By ~ 2

Author(s):

Jan S. Erkelens ◽

Arturo Tejada ◽

Arnold J. den Dekker

Keyword(s):

Electron Microscopy ◽

Time Series ◽

Time Series Models ◽

Transmission Electron ◽

Scanning Transmission ◽

Determination of Nanocluster Sizes from Dark-Field Scanning Transmission Electron Microscopy Images

The Journal of Physical Chemistry C ◽

10.1021/jp710959x ◽

2008 ◽

Vol 112 (6) ◽

pp. 1759-1763 ◽

Cited By ~ 20

Author(s):

Norihiko L. Okamoto ◽

Bryan W. Reed ◽

Shareghe Mehraeen ◽

Apoorva Kulkarni ◽

David Gene Morgan ◽

...

Keyword(s):

Electron Microscopy ◽

Dark Field ◽

Transmission Electron ◽

Scanning Transmission ◽

Deep Learning of Atomically Resolved Scanning Transmission Electron Microscopy Images: Chemical Identification and Tracking Local Transformations

ACS Nano ◽

10.1021/acsnano.7b07504 ◽

2017 ◽

Vol 11 (12) ◽

pp. 12742-12752 ◽

Cited By ~ 92

Author(s):

Maxim Ziatdinov ◽

Ondrej Dyck ◽

Artem Maksov ◽

Xufan Li ◽

Xiahan Sang ◽

...

Keyword(s):

Electron Microscopy ◽

Deep Learning ◽

Chemical Identification ◽

Transmission Electron ◽

Scanning Transmission ◽

Understanding of scanning-system distortions of atomic-scale scanning transmission electron microscopy images for accurate lattice parameter measurements

Journal of Materials Science ◽

10.1007/s10853-020-04602-w ◽

2020 ◽

Vol 55 (19) ◽

pp. 8123-8133 ◽

Cited By ~ 1

Author(s):

Syota Fujinaka ◽

Yukio Sato ◽

Ryo Teranishi ◽

Kenji Kaneko

Keyword(s):

Electron Microscopy ◽

Lattice Parameter ◽

Atomic Scale ◽

Scanning System ◽

Transmission Electron ◽

Scanning Transmission ◽

Simulation of high angle annular dark field scanning transmission electron microscopy images of large nanostructures

Applied Physics Letters ◽

10.1063/1.2998656 ◽

2008 ◽

Vol 93 (15) ◽

pp. 153107 ◽

Cited By ~ 38

Author(s):

J. Pizarro ◽

P. L. Galindo ◽

E. Guerrero ◽

A. Yáñez ◽

M. P. Guerrero ◽

...

Keyword(s):

Electron Microscopy ◽

Dark Field ◽

High Angle ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Deconvolution of scanning transmission electron microscopy images of ionomers

Journal of Polymer Science Part B Polymer Physics ◽

10.1002/polb.10383 ◽

2003 ◽

Vol 41 (4) ◽

pp. 319-326 ◽

Cited By ~ 7

Author(s):

Brian P. Kirkmeyer ◽

Richard C. Puetter ◽

Amos Yahil ◽

Karen I. Winey

Keyword(s):

Electron Microscopy ◽

Transmission Electron ◽

Scanning Transmission ◽

Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts

Nature Communications ◽

10.1038/ncomms5155 ◽

2014 ◽

Vol 5 (1) ◽

Cited By ~ 157

Author(s):

Andrew B. Yankovich ◽

Benjamin Berkels ◽

W. Dahmen ◽

P. Binev ◽

S. I. Sanchez ◽

...

Keyword(s):

Electron Microscopy ◽

Precision Analysis ◽

Transmission Electron ◽

Scanning Transmission ◽

How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images?

Ultramicroscopy ◽

10.1016/j.ultramic.2016.12.013 ◽

2017 ◽

Vol 181 ◽

pp. 134-143 ◽

Cited By ~ 3

Author(s):

M. Alania ◽

A. De Backer ◽

I. Lobato ◽

F.F. Krause ◽

D. Van Dyck ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron ◽

Scanning Transmission ◽

Tilt Series ◽

Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images

Physical Review B ◽

10.1103/physrevb.80.174106 ◽

2009 ◽

Vol 80 (17) ◽

Cited By ~ 50

Author(s):

James M. LeBeau ◽

Adrian J. D’Alfonso ◽

Scott D. Findlay ◽

Susanne Stemmer ◽

Leslie J. Allen

Keyword(s):

Electron Microscopy ◽

Bright Field ◽

Transmission Electron ◽

Scanning Transmission ◽