Effective attenuation lengths for quantitative determination of surface composition by Auger-electron spectroscopy and X-ray photoelectron spectroscopy

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/j.elspec.2017.04.008 ◽

2017 ◽

Vol 218 ◽

pp. 1-12 ◽

Author(s):

A. Jablonski ◽

C.J. Powell

Keyword(s):

Quantitative Determination ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

Download Full-text

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

10.3403/30124424 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Resolution Analysis ◽

Surface Chemical Analysis

Download Full-text

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution

10.3403/30124110 ◽

2006 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Lateral Resolution ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

Download Full-text

American society for testing and materials. Standard practice for determination of the specimen area contributing to the detected in X-ray photoelectron spectroscopy and Auger electron spectroscopy (E1217-87)

Surface and Interface Analysis ◽

10.1002/sia.740170615 ◽

1991 ◽

Vol 17 (6) ◽

pp. 391-396

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Standard Practice ◽

X Ray ◽

Specimen Area ◽

American Society

Download Full-text

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

10.3403/30124424u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Resolution Analysis ◽

Surface Chemical Analysis

Download Full-text

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution

10.3403/30124110u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Lateral Resolution ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

Download Full-text

Summary of ISO/TC 201 Standard: XXX. ISO 18516: 2006-Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution

Surface and Interface Analysis ◽

10.1002/sia.2771 ◽

2008 ◽

Vol 40 (5) ◽

pp. 966-968 ◽

Author(s):

J. Wolstenholme

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Lateral Resolution ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

Download Full-text

Summary Abstract: Quantitative determination of the surface composition of sulfur‐bearing anion mixtures by Auger electron spectroscopy

Journal of Vacuum Science and Technology ◽

10.1116/1.570437 ◽

1980 ◽

Vol 17 (1) ◽

pp. 214-215 ◽

Author(s):

N. H. Turner ◽

J. S. Murday ◽

D. E. Ramaker

Keyword(s):

Quantitative Determination ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition

Download Full-text

ChemInform Abstract: AN ANALYSIS OF THE SURFACE COMPOSITION OF PASSIVE FILM ON CU-NI ALLOYS BY MEANS OF AUGER ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY

Chemischer Informationsdienst ◽

10.1002/chin.197515019 ◽

1975 ◽

Vol 6 (15) ◽

pp. no-no

Author(s):

YOSHIO TAKASU ◽

SHUN-ICHI MARU ◽

YOSHIHARU MATSUDA ◽

HAZIME SHIMIZU

Keyword(s):

Auger Electron Spectroscopy ◽

Passive Film ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

X Ray ◽

Download Full-text

Surface composition of AlN powders studied by x‐ray photoelectron spectroscopy and bremsstrahlung‐excited Auger electron spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578626 ◽

1993 ◽

Vol 11 (5) ◽

pp. 2681-2686 ◽

Author(s):

H. M. Liao ◽

R. N. S. Sodhi ◽

T. W. Coyle

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

Download Full-text

Quantitative determination of surface composition of sulfur bearing anion mixtures by Auger electron spectroscopy

Analytical Chemistry ◽

10.1021/ac50051a021 ◽

1980 ◽

Vol 52 (1) ◽

pp. 84-92 ◽

Author(s):

N. H. Turner ◽

J. S. Murday ◽

D. E. Ramaker

Keyword(s):

Quantitative Determination ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition

Download Full-text