Thermal emission measurements of ordinary chondrite mineral analogs in a simulated asteroid environment: 1. Constituent mineral phases

Icarus ◽  
2021 ◽  
pp. 114561
Author(s):  
Michael S. Bramble ◽  
Ralph E. Milliken ◽  
William R. Patterson
2021 ◽  
Vol 242 (1) ◽  
Author(s):  
Martyna Jakubowska ◽  
Jolanta Gałązka-Friedman ◽  
Marek Woźniak ◽  
Patrycja Bogusz ◽  
Łukasz Karwowski ◽  
...  

AbstractMössbauer spectra of nonweathered ordinary chondrites consist of four main mineral phases: olivines, pyroxenes, metallic phase and troilite. These minerals represent more than 95% of the whole mass of an ordinary chondrite. Distribution of these mineral phases in micro-scale is not homogeneous. Nevertheless, preparation of representative sample of ordinary chondrite for Mössbauer measurements is possible. To do that a part of 1 g nonweathered material, selected from inside of meteorite without any specific intention is needed. The Warsaw group has been working on investigation of meteorites for 25 years and has analysed about 150 Mössbauer spectra of various meteorites. Among them we found 15 spectra, which could be suspected of being non-representative. These spectra were obtained from Baszkówka, Amber, Bjurböle, Krasnoi-Ugol and Chelyabinsk meteorites. The analysis of how the samples of meteorites were selected for investigation, has shown that the non-representativeness of samples may be due to: intentional choice of sample, preparation of sample from a too small part of material or the use of non-credible source of meteoritic samples. For confirmation of these assumptions, we used a new method of classification of ordinary chondrites – the 4M method. It turned out that this method is a very useful tool for investigation of non-representative samples of equilibrated ordinary chondrites.


Author(s):  
William F. Chambers ◽  
Arthur A. Chodos ◽  
Roland C. Hagan

TASK8 was designed as an electron microprobe control program with maximum flexibility and versatility, lending itself to a wide variety of applications. While using TASKS in the microprobe laboratory of the Los Alamos National Laboratory, we decided to incorporate the capability of using subroutines which perform specific end-member calculations for nearly any type of mineral phase that might be analyzed in the laboratory. This procedure minimizes the need for post-processing of the data to perform such calculations as element ratios or end-member or formula proportions. It also allows real time assessment of each data point.The use of unique “mineral codes” to specify the list of elements to be measured and the type of calculation to perform on the results was first used in the microprobe laboratory at the California Institute of Technology to optimize the analysis of mineral phases. This approach was used to create a series of subroutines in TASK8 which are called by a three letter code.


Author(s):  
W. T. Pike

With the advent of crystal growth techniques which enable device structure control at the atomic level has arrived a need to determine the crystal structure at a commensurate scale. In particular, in epitaxial lattice mismatched multilayers, it is of prime importance to know the lattice parameter, and hence strain, in individual layers in order to explain the novel electronic behavior of such structures. In this work higher order Laue zone (holz) lines in the convergent beam microdiffraction patterns from a thermal emission transmission electron microscope (TEM) have been used to measure lattice parameters to an accuracy of a few parts in a thousand from nanometer areas of material.Although the use of CBM to measure strain using a dedicated field emission scanning transmission electron microscope has already been demonstrated, the recording of the diffraction pattern at the required resolution involves specialized instrumentation. In this work, a Topcon 002B TEM with a thermal emission source with condenser-objective (CO) electron optics is used.


Author(s):  
S.-S. Lee ◽  
J.-S. Seo ◽  
N.-S. Cho ◽  
S. Daniel

Abstract Both photo- and thermal emission analysis techniques are used from the backside of the die colocate defect sites. The technique is important in that process and package technologies have made front-side analysis difficult or impossible. Several test cases are documented. Intensity attenuation through the bulk of the silicon does not compromise the usefulness of the technique in most cases.


2017 ◽  
Author(s):  
Kathryn E. Powell ◽  
◽  
Raymond E. Arvidson ◽  
Linyun He ◽  
Joseph A. O'Sullivan
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document